H. Xu, B. Da, S.F. Mao, J. Tóth, K. Tőkési and Z.J. Ding
Absolute Extraction of Optical Constants From Reflection Electron Energy-Loss Spectrum Using A Reverse Monte Carlo Method
27th International Conference on Atomic Collisions in Solids (ICACS-27), China (Lanzhou), Jul. 24-29, 2016 (oral).
H. Xu, B. Da, S.F. Mao, J. Tóth, K. Tőkési and Z.J. Ding
Optical Constants of Iron Derived from Reflection Electron Energy-Loss Spectra
International Symposium on (e,2e) Double Photoionization and Related Topics & 18th International Symposium on Polarization and Correlation in Electronic and Atomic Collisions, Spain (San Sebastián), Jul. 2-Aug. 1, 2015 (oral).
H. Xu, B. Da, S.F. Mao, K. Tőkési and Z.J. Ding
Extended Reverse Monte Carlo Method for Extracting Optical Constants of Thin Ni Film from Reflection Electron Energy-Loss Spectroscopy
International Conference on Photonic, Electronic and Atomic Collisions, Spain (Toledo) Jul. 22-28, 2015 (oral).
Z. Ruan, M. Zhang, R.G. Zeng, B. Da, Y. Ming, S.F. Mao and Z.J. Ding
Quantum Monte Carlo Simulation for Atomic Resolution SEM/STEM Image
Microsc. Microanal. 20 (Suppl 3) (2014) 30-31.
6th Meeting of the International Union of Microbeam Analysis Societies (IUMAS) conjuncted with Microscopy & Microanalysis (M&M) 2014, USA (Hartford), Aug. 2-7, 2014 (oral).
Y.B. Zou, P. Zhang, S.F. Mao and Z.J. Ding
Model-Based Library for Critical Dimension Metrology by CD-SEM
Microsc. Microanal. 20 (Suppl 3) (2014) 6-7.
6th Meeting of the International Union of Microbeam Analysis Societies (IUMAS) conjuncted with Microscopy & Microanalysis (M&M) 2014, USA (Hartford), Aug. 2-7, 2014 (oral).
Z. Ruan, P. Zhang, S.F. Mao, H.M. Li and Z. J. Ding
Monte Carlo Study of the Influence of Electron Beam Focusing to SEM Image Sharpness Measurement
9th International Symposium on Atomic Level Characterizations for New Materials and Devices'13--ALC'13, USA (Hawaii), Dec. 2-6, 2013 (poster).
X. Ding, B. Da, J.B. Gong, S.F. Mao and Z.J. Ding
Influence of Surface Topography on Elastically Backscattered Electrons
XXVIII International Conference on Photonic, Electronic and Atomic Collisions--ICPEAC 2013, China (Lanzhou), Jul. 24-30, 2013 (poster).
J. Phys.: Conf. Ser. 488 (2014) 132005.
R.J. Bereczky, J. Tóth, B. Da, S.F. Mao, Z.J. Ding and K. Tőkési
Optical Properties of Nickel Derived from Reflection Electron Energy Loss Spectra
XXVIII International Conference on Photonic, Electronic and Atomic Collisions--ICPEAC 2013, China (Lanzhou), Jul. 24-30, 2013 (poster).
J. Phys.: Conf. Ser. 488 (2014) 132007.
Z.J. Ding, B. Da and S.F. Mao
A New Method for Deriving Optical Constants of Solids from Reflection Electron Energy Loss Spectroscopy Spectrum
71st IUVSTA Workshop on Characterisation of Nanostructures by Means of Electron Beam Techniques, Austria (Castle Herrnstein), Jun. 24-28, 2013 (invited).
Z. Ruan, S.F. Mao, P. Zhang, H.M. Li and Z.J. Ding
Monte Carlo Simulation of Realistic Beam-Sample Interaction in SEM: Application to Evaluation of Sharpness Measurement Methods
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, USA (Baltimore), Apr. 29-May 3, 2013 (oral).
P. Zhang, Z.M. Zhang, S.F. Mao and Z.J. Ding
Monte Carlo Study of the Influence of Electron Beam Focusing to SEM Linewidth Measurement
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, USA (Baltimore), Apr. 29-May 3, 2013 (oral).
Z.M. Zhang, T. Tang, S.F. Mao and Z.J. Ding
Monte Carlo Simulation of X-ray Photoemission Electron Microscopic Image
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, USA (Baltimore), Apr. 29-May 3, 2013 (oral).
Z.J. Ding, P. Zhang, B. Da, Z. Ruan and S.F. Mao
Monte Carlo Simulation of Scanning Electron Microscopy Images and Surface Excitation at Rough Surfaces
IUVSTA Workshop for Surface Analysis and Standardization 2013--iSAS-13, Japan (Okinawa), Jan. 15-19, 2013 (invited).
B. Da, S.F. Mao and Z.J. Ding
A Reverse Monte Carlo Method for Extraction of Energy Loss Function Data from an Experimental REELS Spectrum
International Symposium on Surface Science--ISSS-6, Japan (Tokyo), Dec. 11-15, 2011 (poster).
Z. Ruan, S.F. Mao, P. Zhang and Z.J. Ding
Monte Carlo Modeling for SEM Image Simulation-Realistic Surface Topography and Instrumental Condition
2011 International Conference on Computational Intelligence and Software Engineering--CiSE 2011, China (Wuhan), Dec. 9-11, 2011 (oral).
S.F. Mao and Z.J. Ding
A Monte Carlo Study of Spin Polarization of Secondary Electrons
8th International Symposium on Atomic Level Characterizations for New Materials and Devices--ALC-11, Korea (Seoul), May 22-27, 2011 (oral).
Young Scientist Award
B. Da, S.F. Mao, G.H. Zhang, X.X. Yu, X.P. Wang and Z.J. Ding
Modeling of Surface Excitation Effect for Rough Surfaces
8th International Symposium on Atomic Level Characterizations for New Materials and Devices--ALC-11, Korea (Seoul), May 22-27, 2011 (oral).
Z.J. Ding, P. Zhang, R.G. Zeng and S.F. Mao
Recent Development of Monte Carlo Methods for Study of Electron-Solid Interactions
8th International Symposium on Atomic Level Characterizations for New Materials and Devices--ALC-11, Korea (Seoul), May 22-27, 2011 (oral).
Z.J. Ding, Z.M. Zhang, S.F. Mao, B. Da, R.G. Zeng, P. Zhang, H.P. Mei, Y.G. Li and H.M. Li
Theoretical Study of Electron Interaction with Solid Surface for Application to Surface Electron Spectroscopy and Microscopy
18th International Vacuum Congress--IVC-18, China (Beijing), Aug. 23-27, 2010 (invited).
Z.J. Ding, S.F. Mao, Y.G. Li and Z.M. Zhang
A Monte Carlo Simulation of Secondary Electron Excitation
55th IUVSTA Workshop on Electron Transport Parameters Applied in Surface Analysis, Hungary (Siofok), Sep. 14-17, 2008 (invited).
Z.J. Ding, Y.G. Li, S.F. Mao, R.G. Zeng, H.M. Li and Z.M. Zhang
Monte Carlo Simulation of Electron Interaction with Solids and Surfaces
4th Conference on Elementary Processes in Atomic Systems, Romania (Cluj-Napoca), Jun. 18-20, 2008 (invited).
Z.J. Ding, Y.G. Li, S.F. Mao, H.M. Li, Z.M. Zhang
A Monte Carlo Modelling of Electron Signals in SEM Imaging
Workshop on Electron and Ion Beam Modelling (Scanning-2008), USA (Gaithersburg), Apr. 15-17, 2008 (invited).
Z.J. Ding, Y.G. Li, S.M. Xiao, S.F. Mao, H.M. Li and Z.M. Zhang
Monte Carlo Simulation of SEM and AEM Images
6th International Symposium on Atomic Level Characterizations for New Materials and Devices, Japan (Kanazawa), 2007 (invited).
S.F. Mao, Z.M. Zhang, K. Tokesi, A. Csik, J. Toth, R.J. Bereczky and Z.J. Ding
XPS Study of Nano Thin Films on Substrate
12th European Conference on Applications of Surface and Interface Analysis, Belgium (Brussels), 2007 (poster).
S.F. Mao and Z.J. Ding
Monte Carlo Simulation of Dopant Contrast in SEM Image
International Conference on Nanoscience & Technology, China (Beijing), 2007 (poster)(Best Poster Award).
Z.J. Ding, S.F. Mao, Y.G. Li, H.Y. Wang, H.M. Li, Z.M. Zhang and K. Tokesi
Monte Carlo Simulation of Electron Signal Emission from Nanostructures
International Workshop on Modeling and Standardization of Electron Spectroscopies for Surface Analysis, Belgium (Brussels), 2006 (invited).