学术论文

J.B. Gong, R.C. Dai, Z.P. Wang and Z.M. Zhang
Temperature Dependent Optical Constants for SiO2 Film on Si Substrate by Ellipsometry
Mater. Res. Exp. 4 (2017) 085005.

J.B. Gong, R.C. Dai, Z.P. Wang and Z.M. Zhang
Thickness Dispersion of Surface Plasmon of Ag Nano-thin Films: Determination by Ellipsometry Iterated with Transmittance Method
Sci. Rep. 5 (2015) 9279.

X. Ding, B. Da, J.B. Gong, S.F. Mao, H.M. Li and Z.J. Ding
Quantification of Surface Roughness Effect on Elastically Backscattered Electrons
Surf. Interface Anal. 46 (2014) 489-496.

J.B. Gong, W.L. Dong, R.C. Dai, Z.P. Wang, Z.M. Zhang and Z.J. Ding
Thickness Dependence of the Optical Constants of Oxidized Copper Thin Films Based on Ellipsometry and Transmittance
Chin. Phys. B 23 (2014) 087802.
International Conference on Nanoscience and Technology, China 2013--ChinaNANO 2013, China (Beijing), Sep. 5-7, 2013 (oral).

J.B. Gong, Z.L. Sui, Y.H. Deng, R.C. Dai, Z.P. Wang, Z.M. Zhang and Z.J. Ding
High-Pressure Study of Micro- and Nano-Crystals HoVO4
7th International Conference on Rare Earth Development and Application--ICRE2013, China (Ganzhou), Aug. 11-13, 2013 (oral).

Z.P. Wang, Z.M. Zhang, R.C. Dai, Z.L. Sui, J.B. Gong, Y.H. Deng and Z.J. Ding
The Luminescence Study of Eu3+-Doped Single Crystal Szaibelyite MgBO2(OH) under High Pressure and High Temperature
7th International Conference on Rare Earth Development and Application--ICRE2013, China (Ganzhou), Aug. 11-13, 2013 (oral).

X. Ding, B. Da, J.B. Gong, S.F. Mao and Z.J. Ding
Influence of Surface Topography on Elastically Backscattered Electrons
XXVIII International Conference on Photonic, Electronic and Atomic Collisions--ICPEAC 2013, China (Lanzhou), Jul. 24-30, 2013 (poster).
J. Phys.: Conf. Ser. 488 (2014) 132005.

Y.H. Deng, Z.L. Sui, J.B. Gong, R.C. Dai, Z.P. Wang, Z.M. Zhang and Z.J. Ding
Pressure-Induced Reverse Reaction of the Photochemical Decomposition of Germanium Tetraiodide Molecular Crystal
J. Phys. Chem. C 117 (2013) 25012-25018.

T. Tang, Z.M. Zhang, B. Da, J.B. Gong, K. Goto and Z.J. Ding
Method for a Quick Estimation of Energy Dependent Reflection Electron Energy Loss Spectroscopy Spectra for Al and Si
Physica B 423 (2013) 64-68.