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2016-01-05:
SE yield of C/Cu
2015-11-24:
SE yield of multi layer structure specimen(3)
2015-06-02:
SE intensity of multi layer structure
2015-05-05:
Notes and details of the standard
2015-04-21:
CD-SEM simulation modeling of PMMA
2015-03-24:
Method of Metrology Critical Dimension by CD-SEM(草稿)
2015-01-27:
年终总结
2015-01-20:
Roughness Edge Generation
2014-12-23:
Roughness Edge Generation
2014-11-25:
zyb组会报告(21)
2014-10-28:
zyb组会报告(20)
2014-06-17:
Detector of SEM
2014-05-27:
Result and disscution of escape depth
2014-04-29:
CD线宽确定算法
2014-04-01:
Control of line edge in the process of bulding model for CD-SEM simulation
2014-03-04:
Determination algorithm for line width by CD-SEM(15)
2014-01-02:
CD-SEM 粗糙构件模拟(1)
2013-12-12:
纳米线宽数据库(4)
2013-11-14:
纳米线宽数据库(3)
2013-10-17:
纳米线宽数据库(2)
2013-09-12:
纳米线宽数据库(1)
2013-07-01:
纳米线宽测量-1
2013-06-03:
纳米线宽测量综述
2013-05-13:
二次电子逸出深度2
2013-04-22:
二次电子逸出深度
2013-03-25:
IMFP/MED/EAL文献调研
2012-12-24:
学习报告
2012-11-26:
学习报告
2012-11-05:
文献报告