丁泽军、阮瞩
微束分析 扫描电子显微术 图像锐度评估方法
国家标准，GB/T 33838-2017 (2017.05.31发布，2018.04.01实施).
张增明、丁泽军、毛世峰、曾荣光、达博、张鹏、阮瞩、唐涛
表面化学分析 俄歇电子能谱 荷电控制与校正方法报告的规范要求
国家标准，GB/T 32998-2016 (2016.10.13发布，2017.09.01实施).
Z. Ruan, R.G. Zeng, Y. Ming, M. Zhang, B. Da, S.F. Mao and Z.J. Ding
Quantum Trajectory Monte Carlo Method for Study of Electron-Crystal Interaction in STEM
Phys. Chem. Chem. Phys. 17 (2015) 17628-17637.
Z. Ruan, M. Zhang, R.G. Zeng, B. Da, Y. Ming, S.F. Mao and Z.J. Ding
Quantum Monte Carlo Simulation for Atomic Resolution SEM/STEM Image
Microsc. Microanal. 20 (Suppl 3) (2014) 30-31.
6th Meeting of the International Union of Microbeam Analysis Societies (IUMAS) conjuncted with Microscopy & Microanalysis (M&M) 2014, USA (Hartford), Aug. 2-7, 2014 (oral) (Early Career Scholarship Award).
Z. Ruan, M. Zhang, R.G. Zeng, Y. Ming, B. Da, S.F. Mao and Z.J. Ding
Simulation Study of the Atomic Resolution Secondary Electron Imaging
Surf. Interface Anal. 46 (2014) 1296-1300.
9th International Symposium on Atomic Level Characterizations for New Materials and Devices'13--ALC'13, USA (Hawaii), Dec. 2-6, 2013 (poster) (Student Award).
Z. Ruan, P. Zhang, S.F. Mao, H.M. Li and Z.J. Ding
Monte Carlo Study of the Influence of Electron Beam Focusing to SEM Image Sharpness Measurement
e-J. Surf. Sci. Nanotech. 2 (2014) 247-251.
9th International Symposium on Atomic Level Characterizations for New Materials and Devices'13--ALC'13, USA (Hawaii), Dec. 2-6, 2013 (poster).
Z. Ruan, S.F. Mao, P. Zhang, H.M. Li and Z.J. Ding
Monte Carlo Simulation of Realistic Beam-Sample Interaction in SEM: Application to Evaluation of Sharpness Measurement Methods
Proc. of SPIE 8729 (2013) 87290J.
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, USA (Baltimore), Apr. 29-May 3, 2013 (oral).