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2009-06-12:
SEM模拟程序对构件的出射修正
2009-04-10:
XPS膜厚测量
2009-01-05:
Prediction formula of IMFP
2008-11-24:
Refinement of Monte Carlo simulations of electron-specimen interaction in low-voltage SEM
2008-11-10:
近自由电子金属的IMFP公式拟合(I)
2008-10-27:
近自由电子金属的IMFP公式拟合(I)
2008-10-13:
近自由电子金属的IMFP和SP计算
2008-09-22:
Al的符合谱模拟
2008-06-23:
Coincidence Electron Spectroscopy (II)
2008-05-26:
Monte Carlo Simulation of Low Energy Electron Scattering in Solids
2008-05-12:
Monte Carlo Simulation of Low Energy Electron Scattering in Solids
2008-04-28:
Contrast of the Ball on the Substrate
2008-04-07:
Coincidence Electron Spectroscopy (I)
2008-01-15:
非弹性平均自由程-理论比较
2007-10-16:
表面激发在谱计算中的计入
2007-09-18:
Work Report
2007-07-09:
Application of thin films
2007-06-25:
Measurement of oxide thickness in SiO2/Si overlayer
2007-06-11:
Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy
2007-05-21:
Surface nanostructure determination by x-ray photoemission spectroscopy peak shape analysis
2007-05-07:
Dopant contrast in SEM image
2007-04-02:
Monte Carlo simulation of spin polarization of secondary electrons
2007-03-19:
过渡金属中的二次电子自旋极化
2007-01-18:
北京量子输运讲习班内容介绍
2006-12-14:
2006-11-30:
Space-time evolution of electron cascades in diamond
2006-10-12:
对Full Penn Algorithm结果的重新计算
2006-09-21:
通过Full Penn Algorithm得到的Cu,Al,Si的阻止本领及IMFP
2006-06-21:
Al的二次电子模拟
2006-04-30:
二次电子的激发终态能量
2006-03-22:
近期工作进展
2006-01-06:
近期工作进展
2005-12-14:
半导体掺杂衬度实验结果以及理论解释总结
2005-11-02:
由光学介电常数外推
2005-09-21:
半导体的介电函数
2005-04-20:
Work Report
2004-05-13:
掺杂浓度二次电子象的机制