Y. Ming, L. Ye, H.S. Chen, S.F. Mao, H.M. Li and Z.J. Ding
Solitons as Candidates for Energy Carriers in Fermi-Pasta-Ulam Lattices
Phys. Rev. E 97 (2018) 012221.
P. Zhang, H.Y. Wang, Y.G. Li, S.F. Mao and Z.J. Ding
Monte Carlo Simulation of Secondary Electron Images for Real Sample Structures in Scanning Electron Microscopy
Scanning (2011, in press).
Y.G. Li, S.F. Mao and Z.J. Ding
Chapter 11. Monte Carlo Simulation of SEM and SAM Images
《Applications of Monte Carlo Method in Science and Technology》(Ed. S. Mark and S. Mordechai, InTech-Open Access Publisher, 2011) p231-296.
S.F. Mao and Z.J. Ding
A Monte Carlo Simulation Study on the Image Resolution in Scanning Electron Microscopy
13th European Conference on Applications of Surface and Interface Analysis--ECASIA'09, Turkey (Antalya), Oct. 18-23, 2009 (oral).
Surf. Interface Anal. 42 (2010) 1096-1099.
Z.J. Ding, Y.G. Li, S.F. Mao, H.M. Li and Z.M. Zhang
Monte Carlo Simulation Study on CD-SEM Image for Linewidth Measurement
5th Sino-German Symp. Micro- & Nano- Produc., Measure. & Appl., China (Shanghai-Wuzhen), Sep. 25-30, 2009 (invited).
Z.J. Ding, Y.G. Li, R.G. Zeng, S.F. Mao, P. Zhang and Z.M. Zhang
Depth Distribution Functions of Secondary Electron Production and Emission
International Workshop for Surface Analysis and Standardization'09, Japan (Okinawa), March 15-18, 2009 (invited).
J. Surf. Anal. 15 (2009) 249-253.
S.F. Mao and Z.J. Ding
Monte Carlo Simulation of Dopant Contrast in SEM Image
International Conference on Nanoscience & Technology, China (Beijing), 2007 (poster)(Best Poster Award).
J. Nanosci. Nanotechnol. 9 (2009) 1644-1646.
S.F. Mao, Y.G. Li, R.G. Zeng and Z.J. Ding
Electron Inelastic Scattering and Secondary Electron Emission Calculated without the Single-Pole Approximation
J. Appl. Phys. 104 (2008) 114907.
R.G. Zeng, Z.J. Ding, Y.G. Li and S.F. Mao
A Calculation of Backscattering Factor Database for Quantitative Analysis by Auger Electron Spectroscopy
J. Appl. Phys. 104 (2008) 114909.
Y.G. Li, Z.M. Zhang, S.F. Mao and Z.J. Ding
Monte Carlo Simulation Study of Quasi-Elastic Electron Scattering from an Overlayer/Substrate System
J. Phys.: Condens. Matter 20 (2008) 355005.
Y.G. Li, S.F. Mao, H.M. Li, S.M. Xiao and Z.J. Ding
Monte Carlo Simulation Study of SEM Images of Rough Surfaces
J. Appl. Phys. 104 (2008) 064901.
S.F. Mao, Z.M. Zhang, K. Tokesi, A. Csik, J. Toth, R.J. Bereczky and Z.J. Ding
XPS Study of Nano Thin Films on Substrate
12th European Conference on Applications of Surface and Interface Analysis, Belgium (Brussels), 2007.
Surf. Interface Anal. 40 (2008) 728-730.