N. Muhammad, M. U. Muzaffar, H.M. Li and Z.J. Ding
Optoelectronic Properties of Ultra-wide-bandgap Semiconductor NaYO2: A First-principles Study
Chin. J. Chem. Phys. 36 (2023) 186-192.
Y. Ming, H. Hu, H.M. Li, Z.J. Ding and J. Ren
Universal Kardar-Parisi-Zhang Transient Diffusion in Nonequilibrium Anharmonic Chains
Phys. Rev. E 107 (2023) 014204.
M.S.S. Khan, L.H. Yang, X. Deng, S.F. Mao, Y.B. Zou, Y.G. Li, H.M. Li and Z.J. Ding
Critical-Dimension Scanning Electron Microscope Characterization of Smoothly Varying Wave Structures with a Monte Carlo Simulation
J. Phys. D 54 (2021) 445301.
D.B. Lu, Z.F. Hou, H.M. Li, B. Da and Z.J. Ding
Effect of Single-hydrogen-induced Out-of-plane Passivation on Plasmon Excitation in Nanostructured Graphene
Appl. Surf. Sci. 553 (2021) 149558.
C. Li, H.M. Li and Z.J. Ding
Multiple Coupled Charge Layers in Electron Beam Induced Charging Phenomenon
J. Appl. Phys. 128 (2020) 024902.
A. Hussain, L.H. Yang, Y.B. Zou, B. Da, S.F. Mao, H.M. Li and Z.J. Ding
Monte Carlo Simulation Study of Electron Yields from Semiconductor Materials
J. Appl. Phys. 128 (2020) 015305.
A. Hussain, L.H. Yang, Y.B. Zou, S.F. Mao, B. Da, H.M. Li and Z.J. Ding
Theoretical Calculation of Mean Escape Depth of Secondary Electron Emission from Compound Semiconductor Materials
J. Appl. Phys. 127 (2020) 125304.
Z.J. Ding, Y.B. Zou, Y.G. Li and H.M. Li
Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO 21466:2019.
Mehnaz, L.H. Yang, Y.B. Zou, B. Da, S.F. Mao, H.M. Li, Y.F. Zhao and Z.J. Ding
A Comparative Study on Monte Carlo Simulations of Electron Emission from Liquid Water
Med. Phys. 47 (2020) 759-771.
L.H. Yang, K. Tőkési, J. Tóth, B. Da, H.M. Li and Z.J. Ding
Optical Properties of Silicon and Germanium Determined by High-Precision Analysis of Reflection
Electron Energy Loss Spectroscopy Spectra
Phys. Rev. B 100 (2019) 245209.
Y. Ming, L. Ye, D.B. Ling, H.S. Chen, H.M. Li and Z.J. Ding
Numerical Extraction of Sound Velocities of Energy Transfer Based on Solitons in Fermi-Pasta-Ulam Chains
Phys. Rev. E 98 (2018) 032215.
Y.B. Zou, M.S.S. Khan, H.M. Li, Y.G. Li, W. Li, S.T. Gao, L.S. Liu and Z.J. Ding
Use of Model-Based Library in Critical Dimension Measurement by CD-SEM
Measurement 123 (2018) 150-162.
C. Li, S.F. Mao, Y.B. Zou, Y.G. Li, P. Zhang, H.M. Li and Z.J. Ding
A Monte Carlo Modeling on Charging Effect for Structures with Arbitrary Geometries
J. Phys. D: Appl. Phys. 51 (2018) 165301.
Y. Ming, L. Ye, H.S. Chen, S.F. Mao, H.M. Li and Z.J. Ding
Solitons as Candidates for Energy Carriers in Fermi-Pasta-Ulam Lattices
Phys. Rev. E 97 (2018) 012221.
S.U. Rehman, H.M. Li and Z.J. Ding
Structural and Electronic Properties of CdSe/ZnS and ZnS/CdSe Core/Shell Nanowires via First Principles Study
J. Phys. Chem. Solids 116 (2018) 37-42.
D.S. You, H.M. Li and Z.J. Ding
Monte Carlo Simulation of Auger Electron Emission from Thin Film on Substrate
J. Electr. Spectrosc. Rela. Phenom. 222 (2018) 156-161.
S.U. Rehman, Z.Y. Li, H.M. Li and Z.J. Ding
Band Gap Modulation and Indirect to Direct Band Gap Transition in ZnS/Si and Si/ZnS Core/Shell Nanowires
Physica B 524 (2017) 163-172.
Y. Min, D.B. Ling, H.M. Li and Z.J. Ding
Energy Thresholds of Discrete Breathers in Thermal Equilibrium and Relaxation Processes
Chaos 27 (2017) 063106.
Y. Ming, H.M. Li and Z.J. Ding
Thermal Rectification and Negative Differential Thermal Conductance in Harmonic Chains with Nonlinear System-Bath Coupling
Phys. Rev. E 93 (2016) 032127.
X. Ding, B. Da, J.B. Gong, S.F. Mao, H.M. Li and Z.J. Ding
Quantification of Surface Roughness Effect on Elastically Backscattered Electrons
Surf. Interface Anal. 46 (2014) 489-496.
Z. Ruan, P. Zhang, S.F. Mao, H.M. Li and Z. J. Ding
Monte Carlo Study of the Influence of Electron Beam Focusing to SEM Image Sharpness Measurement
e-J. Surf. Sci. Nanotech. 2 (2014) 247-251.
9th International Symposium on Atomic Level Characterizations for New Materials and Devices'13--ALC'13, USA (Hawaii), Dec. 2-6, 2013 (poster).
Z. Ruan, S.F. Mao, P. Zhang, H.M. Li and Z.J. Ding
Monte Carlo Simulation of Realistic Beam-Sample Interaction in SEM: Application to Evaluation of Sharpness Measurement Methods
Proc. of SPIE 8729 (2013) 87290J.
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, USA (Baltimore), Apr. 29-May 3, 2013 (oral).
Y. Ming, Z.X. Wang, Z.J. Ding and H.M. Li
Ballistic Thermal Rectification in Asymmetric Three-Terminal Mesoscopic Dielectric Systems
New J. Phys. 12 (2010) 103041.
X. Mu, X. Sun, H.M. Li and Z.J. Ding
First-Principles Study of NO Adsorbed Ni(100) Surface
International Conference on Nanoscience & Technology--ChinaNano 2009, China (Beijing), Sep. 1-3, 2009 (oral).
J. Nanosci. Nanotechnol. 10 (2010) 7336-7339.
Z.J. Ding, Y.G. Li, S.F. Mao, H.M. Li and Z.M. Zhang
Monte Carlo Simulation Study on CD-SEM Image for Linewidth Measurement
5th Sino-German Symp. Micro- & Nano- Produc., Measure. & Appl., China (Shanghai-Wuzhen), Sep. 25-30, 2009 (invited).
Z.J. Ding, H.M. Li, K. Goto and R. Shimizu
On the Energy Distribution of Secondary Electrons Emitted from Metals
J. Surf. Anal. 15 (2008) 186-194.
(a special issue for celebration of retirement of Prof. K. Goto).
Y.G. Li, S.F. Mao, H.M. Li, S.M. Xiao and Z.J. Ding
Monte Carlo Simulation Study of Scanning Electron Microscopy Images of Rough Surfaces
J. Appl. Phys. 104 (2008) 064901.
Z.J. Ding, Y.G. Li, S.F. Mao, R.G. Zeng, H.M. Li, Z.M. Zhang
Monte Carlo Simulation of Electron Interaction with Solids and Surfaces
4th Conference on Elementary Processes in Atomic Systems, Romania (Cluj-Napoca), June 18-20, 2008 (invited).
Z.J. Ding, Y.G. Li, S.M. Xiao, S.F. Mao, H.M. Li, Z.M. Zhang
Monte Carlo Simulation of SEM and AEM Images
6th International Symposium on Atomic Level Characterizations for New Materials and Devices, Japan (Kanazawa), 2007 (invited).
S.M. Xiao, Z.M. Zhang, H.M. Li and Z.J. Ding
Monte Carlo Simulation of SEM Image of Sidewall Shape for Linewidth Measurement
International Conference on Nanoscience & Technology, China (Beijing), 2007 (oral).
J. Nanosci. Nanotechnol. 9 (2009) 1655-1658.
Z.J. Ding, S.F. Mao, Y.G. Li, H.Y. Wang, H.M. Li, Z.M. Zhang and K. Tokesi
Monte Carlo Simulation of Electron Signal Emission from Nanostructures
International Workshop on Modeling and Standardization of Electron Spectroscopies for Surface Analysis, Belgium (Brussels), 2006 (invited).
Z.J. Ding, Y.G. Li, H.Y. Wang, H.M. Li, Z.M. Zhang and X. Sun
Monte Carlo Simulation of Secondary Electron and Auger Electron Signals Emitted from Nanostructures
2nd Internaitonal Symposium on Standard Materials and Metrology for Nanotechnology, Japan (Tokyo), 2006 (invited).
K. Salma, Z.J. Ding, H.M. Li and Z.M. Zhang
Surface Excitation Probabilities in Surface Electron Spectroscopies
Surf. Sci. 600 (2006) 1526-1539.
Z.J. Ding, K. Salma, H.M. Li, Z.M. Zhang, K. Tokesi, D. Varga, J. Toth, K. Goto and R. Shimizu
Monte Carlo Simulation Study of Electron Interaction with Solids and Surfaces
11th European Conference on Applications of Surface and Interface Analysis, Austria (Vienna), 2005 (invited).
Surf. Interface Anal. 38 (2006) 657-663.
Z.M. Zhang, Z.J. Ding, H.M. Li, K. Tokesi, D. Varga and J. Toth
Effective Energy Loss Function of Silver Derived from Reflected Electron Energy Loss Spectra
11th European Conference on Applications of Surface and Interface Analysis, Austria (Vienna), 2005 (oral).
Surf. Interface Anal. 38 (2006) 632-635.
K. Salma, Z.J. Ding, H.M. Li and Z.M. Zhang
Quantification of Surface Effects in Electron Spectroscopy
J. Surf. Anal. 12 (2005) 272-281.
Y.T. Yue, H.M. Li and Z.J. Ding
Monte Carlo Simulation of Secondary Electron and Backscattered Electron Images for a Nanoparticle-Matrix System
J. Phys. D: Appl. Phys. 38 (2005) 1966-1977.
H.M. Li and Z.J. Ding
Monte Carlo Simulation of Secondary Electron and Backscattered Electron Images in Scanning Electron Microscopy for Specimen with Complex Geometric Structure
Scanning 27 (2005) 254-267.
Z.J. Ding and H.M. Li
Application of Monte Carlo Simulation to SEM Image Contrast of Complex Structures
NIST Workshop on Modeling Electron Transport for Applications in Electron and X-ray Analysis and Metrology, USA (Gaitherburg), 2004 (invited).
Surf. Interface Anal. 37 (2005) 912-918.
H.M. Li and Z.J. Ding
A Monte Carlo Simulation of Secondary and Backscattered Electrons Images of SEM
Acta Metall. Sinica 18 (2005) 351-355.
X. Sun, Z.J. Ding, H.M. Li, K. Salma, Z.M. Zhang and W.S. Tan
Monte Carlo Simulation of Spin-Polarized Secondary Electrons from Iron
Acta Metall. Sinica 18 (2005) 325-330.
Z.J. Ding, H.M. Li and X. Sun
Application of Monte Carlo Simulation Method to the Nano-scale Characterization by Scanning Electron Microscopy
Mater. Sci. Forum 475-479 (2005) 4161-4164.
Z.J. Ding, H.M. Li, K. Goto, Y.Z. Jiang and R. Shimizu
Energy Spectra of Backscattered Electrons in Auger Electron Spectroscopy: Comparison of Monte Carlo Simulation with Experiment
J. Appl. Phys. 96 (2004) 4598-4606.
Z.J. Ding, H.M. Li, X.D. Tang and R. Shimizu
Monte Carlo Simulation of Absolute Secondary Electron Yield of Cu
Appl. Phys. A 78 (2004) 585-587.
K. Salma, Z.J. Ding, H.M. Li and Z.M. Zhang
Surface Excitation Parameter in Quantitative Surface Analysis by Electron Spectroscopy
Acta Metall. Sinica 18 (2005) 313-318.
Z.M. Zhang, Z.J. Ding, H.M. Li, X. Sun, R. Shimizu, T. Koshikawa and K. Goto
Energy-Loss Functions Derived from REELS Spectra for Aluminum
Acta Metall. Sinica 18 (2005) 217-222.
Z.J. Ding and H.M. Li
Monte Carlo Simulationof Electron Signals and Image Contrast in SEM
International 10th Beijing Conference and Exhibition on Instrumental Analysis, China (Beijing), 2003 (invited).
Z.J. Ding, H.M. Li, Q.R. Pu, Z.M. Zhang and R. Shimizu
Reflection Electron Energy Loss Spectrum of Surface Plasmon Excitation of Ag: A Monte Carlo Study
Phys. Rev. B 66 (2002) 085411.
Z.J. Ding, X.D. Tang and H.M. Li
Monte Carlo Calculation of the Energy Distribution of Backscattered Electrons
Int. J. Mod. Phys. B 16 (2002) 4405-4412.
H.M. Li, Z.J. Ding, Q.R. Pu and Z.M. Zhang
Monte Carlo Simulation of Surface Electronic Excitation of Noble Metals
Acta Metall. Sinica 15 (2002) 191-197.
X. Sun, Z.J. Ding, Q.R. Pu, H.M. Li, Z.Q. Wu, W.Q. Gu, K.W. Peng, G.J. Wu, F.A. Zhang and N.K. Kang
Monte Carlo Simulation of Electron Transmission Through the Scattering Masks with Angular Limitation for Projection Electron Lithography
J. Appl. Phys. 92 (2002) 3641-3646.
Z.J. Ding, H.M. Li and X.D. Tang
Calculation of Electron-Surface Inelastic Interaction Cross-Section and Monte Carlo Simulation of Surface Excitation
HPC-ASIA2000, vol 2 (IEEE computer society) 1118-1124.
Z.J. Ding, H.M. Li, K. Goto, Y.Z. Jiang and R. Shimizu
Energy Spectra of Backscattered Electrons in AES: Comparison of Monte Carlo Simulation with Experiment
2nd China-Japan Joint Seminar on Atomic Level Characterization, China (Guilin), 2002 (invited).
Z.J. Ding, H.M. Li, X.D. Tang
Applications of Monte Carlo Simulation Method to Surface Characterization
The 8th International Conference on Electronic Materials, China (Xian), 2002 (oral).
Z.J. Ding, H.M. Li, Q.R. Pu, X. Sun, Z.M. Zhang and Z.Q. Wu
Some Applications of Monte Carlo Simulation of Electron Scattering at nm Scale
3rd International Symposium on Atomic Level Characterizations for New Materials and Devices, Japan (Nara), 2001 (invited).