Database of Ding's Microsolid Lab

Cite as: M.S.S. Khan, S.F. Mao, Y.B. Zou, D.B. Lu, B. Da, Y.G. Li and Z.J. Ding, An Extensive Theoretical Quantification of Secondary Electron Emission from Silicon. Vacuum 215 (2023) 112257. DOI: 10.1016/j.vacuum.2023.112257
Click to expand ELF information
Si from photon energy range (eV) and the corresponding dataset in literature
crystal (Palik) 0.01–1.10 [1,2] 1.10-3.10 [3] 3.10-6.00 [4] 6.00–20.0 [5] 20.0–100 [6] 100-2000 [7] 2000-10000 [8]
crystal (Yang) 0.01–200 [9] 200-2000 [7]
doped (Palik) 0.01–1.10 [6,10] 1.10-3.10 [3] 3.10–60 [4] 6.00–20.0 [5] 20.0–100 [6] 100-2000 [7]
TEY of Si
Energy (keV) Yield Error
0.010 0.24809 0.06942
0.015 0.30758 0.08179
0.020 0.37450 0.09326
0.025 0.43699 0.10091
0.030 0.49096 0.11214
0.035 0.54866 0.11473
0.040 0.59906 0.12110
0.045 0.64512 0.12643
0.050 0.68676 0.13126
0.060 0.75737 0.13928
0.070 0.81104 0.14490
0.080 0.85169 0.15054
0.090 0.88170 0.15319
0.100 0.90390 0.15717
0.125 0.93352 0.16527
0.150 0.93844 0.17130
0.175 0.93017 0.17483
0.200 0.91576 0.17593
0.250 0.87717 0.17328
0.300 0.83430 0.16651
0.350 0.79359 0.15820
0.400 0.75615 0.14986
0.450 0.72216 0.14164
0.500 0.69130 0.13387
0.600 0.63908 0.12105
0.700 0.59491 0.10853
0.800 0.55847 0.09840
0.900 0.52673 0.08924
1.000 0.50602 0.08500
1.500 0.41201 0.05922
2.000 0.36395 0.04551
2.500 0.33205 0.03772
3.000 0.30928 0.03168
3.500 0.29227 0.02760
4.000 0.27909 0.02457
4.500 0.26853 0.02209
5.000 0.25977 0.02022
6.000 0.24630 0.01731
7.000 0.23668 0.01531
8.000 0.22811 0.01374
9.000 0.22120 0.01252
10.000 0.21531 0.01151