Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Zr [1]
| Energy (keV) |
Yield |
| 0.020 |
0.302 |
| 0.040 |
0.498 |
| 0.090 |
0.398 |
| 0.141 |
0.721 |
| 0.200 |
0.785 |
| 0.320 |
0.790 |
| 0.400 |
0.735 |
| 0.500 |
0.684 |
| 0.550 |
0.617 |
SEY of Zr [2]
| Energy (keV) |
Yield |
| 0.150 |
0.964 |
| 0.200 |
1.378 |
| 0.250 |
1.560 |
| 0.300 |
1.668 |
| 0.350 |
1.711 |
| 0.400 |
1.711 |
| 0.450 |
1.696 |
| 0.500 |
1.696 |
| 0.550 |
1.668 |
| 0.600 |
1.641 |
| 0.650 |
1.600 |
| 0.700 |
1.560 |
| 0.750 |
1.509 |
| 0.800 |
1.498 |
| 0.850 |
1.460 |
| 0.900 |
1.437 |
| 0.950 |
1.401 |
| 1.000 |
1.300 |
| 1.200 |
1.258 |
| 1.400 |
1.195 |
| 1.500 |
1.101 |
| 1.800 |
1.012 |
| 2.000 |
0.948 |
| 2.500 |
0.836 |
| 3.000 |
0.756 |
| 3.500 |
0.685 |
| 4.000 |
0.636 |
| 4.500 |
0.589 |
| 5.000 |
0.543 |
| 5.000 |
0.543 |
SEY of Zr [3]
| Energy (keV) |
Yield |
| 5.000 |
0.298 |
| 5.000 |
0.511 |
| 30.000 |
0.168 |
| 30.000 |
0.120 |
SEY of Zr [5]
| Energy (keV) |
Yield |
| 0.065 |
1.467 |
| 0.084 |
1.619 |
| 0.106 |
1.822 |
| 0.132 |
1.969 |
| 0.155 |
2.087 |
| 0.184 |
2.115 |
| 0.208 |
2.188 |
| 0.234 |
2.228 |
| 0.260 |
2.245 |
| 0.284 |
2.262 |
| 0.310 |
2.262 |
| 0.337 |
2.256 |
| 0.356 |
2.245 |
| 0.380 |
2.222 |
| 0.485 |
2.143 |
| 0.585 |
2.059 |
| 0.682 |
1.957 |
| 0.782 |
1.890 |
| 0.882 |
1.827 |
| 0.983 |
1.788 |
SEY of Zr [6]
| Energy (keV) |
Yield |
| 0.065 |
0.953 |
| 0.084 |
1.046 |
| 0.107 |
1.139 |
| 0.132 |
1.189 |
| 0.154 |
1.224 |
| 0.177 |
1.224 |
| 0.207 |
1.232 |
| 0.235 |
1.232 |
| 0.254 |
1.232 |
| 0.280 |
1.217 |
| 0.308 |
1.210 |
| 0.331 |
1.189 |
| 0.357 |
1.167 |
| 0.382 |
1.160 |
| 0.481 |
1.110 |
| 0.579 |
1.060 |
| 0.681 |
1.017 |
| 0.784 |
0.996 |
| 0.885 |
0.968 |
| 0.983 |
0.946 |
SEY of Zr [7]
| Energy (keV) |
Yield |
| 0.062 |
1.011 |
| 0.081 |
1.103 |
| 0.107 |
1.210 |
| 0.130 |
1.281 |
| 0.156 |
1.339 |
| 0.182 |
1.367 |
| 0.207 |
1.382 |
| 0.231 |
1.389 |
| 0.256 |
1.389 |
| 0.284 |
1.389 |
| 0.308 |
1.389 |
| 0.334 |
1.382 |
| 0.359 |
1.367 |
| 0.382 |
1.360 |
| 0.483 |
1.303 |
| 0.581 |
1.239 |
| 0.684 |
1.196 |
| 0.787 |
1.153 |
| 0.883 |
1.125 |
| 0.981 |
1.096 |
SEY of Zr [8]
| Energy (keV) |
Yield |
| 0.060 |
1.160 |
| 0.081 |
1.295 |
| 0.107 |
1.467 |
| 0.132 |
1.567 |
| 0.158 |
1.653 |
| 0.184 |
1.673 |
| 0.210 |
1.716 |
| 0.235 |
1.745 |
| 0.256 |
1.759 |
| 0.280 |
1.774 |
| 0.308 |
1.767 |
| 0.334 |
1.774 |
| 0.359 |
1.759 |
| 0.382 |
1.738 |
| 0.485 |
1.673 |
| 0.579 |
1.602 |
| 0.684 |
1.552 |
| 0.782 |
1.496 |
| 0.885 |
1.460 |
| 0.981 |
1.403 |
References:
- [1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
- [2] Walker, C. G.; El-Gomati, M. M.; Assad, A. M.; Zadrazil, M., The secondary electron emission yield for
24 solid elements excited by primary electrons in the range 250-5000 eV: a theory/experiment comparison.
Scanning 2008, 30, 365-80.
- [3] Whetten, N. R., Methods in Experimental Physics. Academic Press, New York: 1962; Vol. IV.
- [4] Wittry, D. B., In: Proc. 4th Conf. on X-ray Optics and Microanalysis, Hermann Paris, Castaing,
R., Ed. Hermann Paris, 1966; p 168.
- [5] Wang, J.; Wang, Y.; Xu, Y. H.; Zhang, B.; Wei, W., Research on the secondary electron yield of TiZrV-Pd
thin film coatings. Vacuum 2016, 131, 81-88.
