Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of V [1]
| Energy (keV) |
Yield |
| 5.000 |
0.350 |
| 30.000 |
0.104 |
| 30.000 |
0.089 |
SEY of V [2]
| Energy (keV) |
Yield |
| 0.063 |
1.292 |
| 0.084 |
1.439 |
| 0.108 |
1.580 |
| 0.134 |
1.625 |
| 0.155 |
1.659 |
| 0.179 |
1.676 |
| 0.208 |
1.681 |
| 0.236 |
1.698 |
| 0.258 |
1.693 |
| 0.282 |
1.693 |
| 0.306 |
1.681 |
| 0.334 |
1.676 |
| 0.360 |
1.676 |
| 0.384 |
1.665 |
| 0.482 |
1.591 |
| 0.580 |
1.546 |
| 0.682 |
1.484 |
| 0.782 |
1.445 |
| 0.885 |
1.405 |
| 0.985 |
1.377 |
SEY of V [3]
| Energy (keV) |
Yield |
| 0.065 |
1.138 |
| 0.087 |
1.255 |
| 0.110 |
1.359 |
| 0.136 |
1.431 |
| 0.162 |
1.457 |
| 0.189 |
1.476 |
| 0.209 |
1.476 |
| 0.235 |
1.476 |
| 0.259 |
1.463 |
| 0.286 |
1.441 |
| 0.310 |
1.418 |
| 0.336 |
1.395 |
| 0.360 |
1.372 |
| 0.383 |
1.353 |
| 0.482 |
1.265 |
| 0.581 |
1.177 |
| 0.682 |
1.115 |
| 0.785 |
1.070 |
| 0.884 |
1.027 |
| 0.981 |
0.992 |
References:
- [1] Wittry, D. B., In: Proc. 4th Conf. on X-ray Optics and Microanalysis, Hermann Paris, Castaing,
R., Ed. Hermann Paris, 1966; p 168.
- [2] Wang, J.; Wang, Y.; Xu, Y. H.; Zhang, B.; Wei, W., Research on the secondary electron yield of TiZrV-Pd
thin film coatings. Vacuum 2016, 131, 81-88.
