SEY of Te

Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield by using Machine Learning Methods. (unpublished).

SEY of Te [1]

Energy (keV)	Yield
0.050	0.420
0.060	0.530
0.070	0.590
0.100	0.690
0.150	0.730
0.240	0.760
0.350	0.796
0.420	0.800
0.520	0.819
0.700	0.792
0.800	0.768
1.000	0.720
1.200	0.607
1.600	0.582
2.000	0.495
2.500	0.418

SEY of Te [2]

Energy (keV)	Yield
1.000	1.630
3.000	0.891
5.000	0.706
10.000	0.376
20.000	0.319
30.000	0.174

SEY of Te [3]

Energy (keV)	Yield
5.000	0.420
5.000	0.323
30.000	0.143

References:

[1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
[2] Reimer, L.; Tolkamp, C., Measuring the backscattering coefficient and secondary electron yield inside a scanning electron microscope. Scanning 1980, 3, 35.
[3] Wittry, D. B., In: Proc. 4th Conf. on X-ray Optics and Microanalysis, Hermann Paris, Castaing, R., Ed. Hermann Paris, 1966; p 168.