Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Sn [1]
| Energy (keV) |
Yield |
| 0.060 |
0.470 |
| 0.086 |
0.536 |
| 0.140 |
0.800 |
| 0.210 |
0.956 |
| 0.300 |
1.025 |
| 0.400 |
1.060 |
| 0.600 |
1.063 |
| 0.800 |
1.037 |
| 1.000 |
0.999 |
| 1.500 |
0.829 |
| 2.000 |
0.713 |
SEY of Sn [2]
| Energy (keV) |
Yield |
| 0.150 |
0.501 |
| 0.200 |
0.647 |
| 0.250 |
0.769 |
| 0.300 |
0.861 |
| 0.350 |
0.936 |
| 0.400 |
0.978 |
| 0.450 |
0.993 |
| 0.500 |
1.008 |
| 0.550 |
1.015 |
| 0.600 |
1.008 |
| 0.650 |
1.008 |
| 0.700 |
1.001 |
| 0.750 |
0.978 |
| 0.800 |
0.963 |
| 0.850 |
0.950 |
| 0.900 |
0.936 |
| 0.950 |
0.928 |
| 1.000 |
0.894 |
| 1.200 |
0.861 |
| 1.400 |
0.810 |
| 1.500 |
0.758 |
| 1.800 |
0.702 |
| 2.000 |
0.656 |
| 2.500 |
0.587 |
| 3.000 |
0.528 |
| 3.500 |
0.479 |
| 4.000 |
0.438 |
| 4.500 |
0.403 |
| 5.000 |
0.371 |
SEY of Sn [3]
| Energy (keV) |
Yield |
| 1.000 |
1.651 |
| 3.000 |
0.891 |
| 5.000 |
0.642 |
| 10.000 |
0.377 |
| 20.000 |
0.307 |
| 30.000 |
0.174 |
References:
- [1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
- [2] Walker, C. G.; El-Gomati, M. M.; Assad, A. M.; Zadrazil, M., The secondary electron emission yield for
24 solid elements excited by primary electrons in the range 250-5000 eV: a theory/experiment comparison.
Scanning 2008, 30, 365-80.
- [3] Reimer, L.; Tolkamp, C., Measuring the backscattering coefficient and secondary electron yield inside a
scanning electron microscope. Scanning 1980, 3, 35.
