Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Sb [1]
| Energy (keV) | Yield |
|---|---|
| 0.100 | 0.341 |
| 0.146 | 0.484 |
| 0.200 | 0.600 |
| 0.300 | 0.786 |
| 0.400 | 0.790 |
| 0.600 | 0.825 |
| 0.800 | 0.820 |
| 1.000 | 0.760 |
| 2.000 | 0.660 |
| 3.000 | 0.580 |
| 4.000 | 0.532 |
| 4.500 | 0.500 |
References:
- [1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
- [2] Joy, D. C.; Joy, C. S. SEMATECH Report # 96063130A-TR; 1996.
- [3] Reimer, L.; Tolkamp, C., Measuring the backscattering coefficient and secondary electron yield inside a scanning electron microscope. Scanning 1980, 3, 35.
