Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Pt [1]
| Energy (keV) |
Yield |
| 0.100 |
0.710 |
| 0.140 |
0.840 |
| 0.200 |
1.033 |
| 0.400 |
1.288 |
| 0.600 |
1.368 |
| 0.800 |
1.391 |
| 1.000 |
1.354 |
| 1.564 |
1.246 |
| 2.000 |
1.176 |
| 3.000 |
1.136 |
| 4.000 |
0.926 |
SEY of Pt [2]
| Energy (keV) |
Yield |
| 0.250 |
0.861 |
| 0.300 |
0.956 |
| 0.350 |
1.054 |
| 0.400 |
1.139 |
| 0.450 |
1.224 |
| 0.500 |
1.265 |
| 0.550 |
1.307 |
| 0.600 |
1.333 |
| 0.650 |
1.350 |
| 0.700 |
1.359 |
| 0.750 |
1.369 |
| 0.800 |
1.369 |
| 0.850 |
1.350 |
| 0.900 |
1.342 |
| 0.950 |
1.323 |
| 1.000 |
1.290 |
| 1.200 |
1.265 |
| 1.400 |
1.200 |
| 1.564 |
1.125 |
| 1.800 |
1.062 |
| 2.000 |
1.000 |
| 2.500 |
0.901 |
| 3.000 |
0.817 |
| 3.500 |
0.746 |
| 4.000 |
0.672 |
| 4.500 |
0.614 |
| 5.000 |
0.578 |
SEY of Pt [3]
| Energy (keV) |
Yield |
| 0.600 |
1.705 |
| 0.700 |
1.600 |
| 0.720 |
1.520 |
| 0.800 |
1.741 |
| 1.200 |
1.529 |
| 1.600 |
1.400 |
| 1.900 |
1.306 |
| 2.500 |
1.200 |
| 3.000 |
1.094 |
| 3.600 |
1.030 |
SEY of Pt [4]
| Energy (keV) |
Yield |
| 0.072 |
0.788 |
| 1.400 |
0.700 |
SEY of Pt [5]
| Energy (keV) |
Yield |
| 0.350 |
1.000 |
| 0.700 |
1.800 |
SEY of Pt [6]
| Energy (keV) |
Yield |
| 0.072 |
0.785 |
| 0.080 |
0.902 |
| 0.110 |
0.996 |
| 0.132 |
1.188 |
| 0.170 |
1.335 |
| 0.240 |
1.490 |
| 0.327 |
1.643 |
| 0.400 |
1.733 |
| 0.500 |
1.795 |
| 0.580 |
1.811 |
| 0.700 |
1.800 |
| 0.800 |
1.751 |
| 1.000 |
1.666 |
| 1.200 |
1.560 |
SEY of Pt [7]
| Energy (keV) |
Yield |
| 0.013 |
0.436 |
| 0.024 |
0.463 |
| 0.034 |
0.489 |
| 0.038 |
0.562 |
| 0.041 |
0.549 |
| 0.055 |
0.615 |
| 0.059 |
0.641 |
| 0.070 |
0.674 |
| 0.080 |
0.747 |
| 0.091 |
0.701 |
| 0.101 |
0.760 |
| 0.112 |
0.794 |
| 0.116 |
0.867 |
| 0.144 |
0.900 |
| 0.147 |
1.006 |
| 0.158 |
0.992 |
| 0.169 |
1.052 |
| 0.176 |
1.131 |
| 0.179 |
1.006 |
| 0.183 |
1.098 |
| 0.186 |
1.105 |
| 0.190 |
1.072 |
| 0.218 |
1.131 |
| 0.222 |
1.164 |
| 0.225 |
1.192 |
| 0.239 |
1.337 |
| 0.250 |
1.377 |
| 0.264 |
1.396 |
| 0.271 |
1.337 |
| 0.282 |
1.390 |
| 0.296 |
1.443 |
| 0.307 |
1.463 |
| 0.314 |
1.509 |
| 0.324 |
1.515 |
| 0.391 |
1.595 |
| 0.416 |
1.622 |
| 0.465 |
1.655 |
| 0.511 |
1.662 |
| 0.564 |
1.662 |
| 0.607 |
1.655 |
| 0.646 |
1.655 |
| 0.692 |
1.655 |
| 0.734 |
1.649 |
| 0.770 |
1.642 |
| 0.801 |
1.622 |
| 0.851 |
1.601 |
| 0.890 |
1.588 |
| 0.928 |
1.581 |
| 0.960 |
1.575 |
| 0.989 |
1.568 |
References:
- [1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
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24 solid elements excited by primary electrons in the range 250-5000 eV: a theory/experiment comparison.
Scanning 2008, 30, 365-80.
- [3] Kanaya, K.; Ono, S., Interaction of electron beams with the target in scanning electron microscope. In:
Electron Beam Interactions with Solids, Kyser, D., Ed. Chicago: 1982; pp 69-98.
- [4] Sternglass, E. J., Backscattering of kilovolt electrons from solids. Phys. Rev. 1954,
95, 345-358.
- [5] Whetten, N. R., Methods in Experimental Physics. Academic Press, New York: 1962; Vol. IV.
- [6] Thomas, S.; Pattinson, E. B., Automatic measurement of secondary electron emission characteristics of
TaC, TiC and ZrC. J. Phys. D: Appl. Phys. 1969, 2, 1539-1547.
- [7] Banon, D.; Socuellamos, J. M.; Mata, R.; Mercade, L.; Gimeno, B.; Boria, V. E.; Raboso, D.; Semenov, V.;
Rakova, E.; Sanchez-Royo, J. F.; Segura, A., Study of the secondary electron yield in dielectrics using
equivalent circuital models. IEEE trans. Plas. Sci. 2018, 46, 859-867.
