Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Pd [1]
| Energy (keV) |
Yield |
| 0.120 |
0.850 |
| 0.200 |
1.070 |
| 0.300 |
1.246 |
| 0.400 |
1.370 |
| 0.500 |
1.410 |
| 0.600 |
1.400 |
| 0.800 |
1.370 |
| 1.000 |
1.300 |
| 1.500 |
1.100 |
| 2.000 |
0.970 |
| 2.500 |
0.840 |
SEY of Pd [2]
| Energy (keV) |
Yield |
| 0.100 |
0.600 |
| 0.300 |
1.340 |
| 0.500 |
1.970 |
| 1.000 |
1.670 |
| 2.000 |
1.180 |
| 3.000 |
0.920 |
| 4.000 |
0.740 |
| 5.000 |
0.670 |
| 6.000 |
0.570 |
| 7.000 |
0.520 |
| 8.000 |
0.470 |
SEY of Pd [3]
| Energy (keV) |
Yield |
| 0.152 |
1.128 |
| 0.152 |
1.179 |
| 0.175 |
1.231 |
| 0.188 |
1.294 |
| 0.224 |
1.400 |
| 0.235 |
1.478 |
| 0.247 |
1.512 |
| 0.283 |
1.558 |
| 0.307 |
1.607 |
| 0.330 |
1.636 |
| 0.366 |
1.653 |
| 0.377 |
1.664 |
| 0.426 |
1.705 |
| 0.437 |
1.716 |
| 0.462 |
1.730 |
| 0.496 |
1.739 |
| 0.532 |
1.742 |
| 0.592 |
1.736 |
| 0.651 |
1.730 |
| 0.700 |
1.722 |
| 0.759 |
1.710 |
| 0.795 |
1.702 |
| 0.842 |
1.693 |
| 0.878 |
1.679 |
| 0.925 |
1.662 |
| 0.985 |
1.647 |
| 1.044 |
1.627 |
| 1.116 |
1.596 |
| 1.223 |
1.564 |
| 1.307 |
1.544 |
| 1.426 |
1.521 |
| 1.509 |
1.504 |
| 1.628 |
1.481 |
| 1.724 |
1.458 |
| 1.807 |
1.438 |
| 1.914 |
1.417 |
| 2.021 |
1.377 |
| 2.117 |
1.357 |
| 2.200 |
1.340 |
| 2.307 |
1.317 |
| 2.414 |
1.297 |
| 2.497 |
1.274 |
| 2.592 |
1.254 |
| 2.711 |
1.239 |
| 2.807 |
1.219 |
| 2.914 |
1.202 |
| 3.009 |
1.182 |
| 3.104 |
1.162 |
| 3.223 |
1.150 |
| 3.306 |
1.136 |
| 3.402 |
1.122 |
| 3.521 |
1.107 |
| 3.605 |
1.096 |
| 3.724 |
1.079 |
| 3.818 |
1.070 |
| 3.903 |
1.050 |
| 4.009 |
1.041 |
| 4.117 |
1.027 |
| 4.211 |
1.016 |
| 4.307 |
1.004 |
SEY of Pd [4]
| Energy (keV) |
Yield |
| 0.140 |
1.099 |
| 0.163 |
1.150 |
| 0.188 |
1.168 |
| 0.224 |
1.214 |
| 0.247 |
1.291 |
| 0.271 |
1.351 |
| 0.283 |
1.369 |
| 0.330 |
1.403 |
| 0.343 |
1.446 |
| 0.366 |
1.463 |
| 0.390 |
1.492 |
| 0.413 |
1.521 |
| 0.426 |
1.535 |
| 0.462 |
1.552 |
| 0.496 |
1.567 |
| 0.509 |
1.575 |
| 0.532 |
1.587 |
| 0.556 |
1.596 |
| 0.592 |
1.598 |
| 0.640 |
1.581 |
| 0.664 |
1.573 |
| 0.736 |
1.561 |
| 0.795 |
1.544 |
| 0.819 |
1.535 |
| 0.866 |
1.524 |
| 0.914 |
1.504 |
| 0.974 |
1.486 |
| 1.010 |
1.472 |
| 1.116 |
1.440 |
| 1.235 |
1.412 |
| 1.307 |
1.377 |
| 1.414 |
1.346 |
| 1.509 |
1.323 |
| 1.605 |
1.285 |
| 1.711 |
1.280 |
| 1.807 |
1.251 |
| 1.902 |
1.231 |
| 1.998 |
1.217 |
| 2.117 |
1.182 |
| 2.212 |
1.179 |
| 2.307 |
1.150 |
| 2.402 |
1.148 |
| 2.509 |
1.136 |
| 2.605 |
1.125 |
| 2.700 |
1.105 |
| 2.807 |
1.084 |
| 2.902 |
1.084 |
| 3.009 |
1.073 |
| 3.104 |
1.053 |
| 3.200 |
1.047 |
| 3.295 |
1.041 |
| 3.414 |
1.030 |
| 3.521 |
1.021 |
| 3.616 |
1.021 |
| 3.724 |
1.013 |
| 3.807 |
1.007 |
| 3.914 |
0.999 |
References:
- [1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
- [2] Joy, D. C., A database of electron-solid interactions. (2008).
- [3] Wang, J.; Wang, Y.; Xu, Y. H.; Zhang, B.; Wei, W., Research on the secondary electron yield of TiZrV-Pd
thin film coatings. Vacuum 2016, 131, 81-88.
