Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Mo [1]
| Energy (keV) |
Yield |
| 0.048 |
0.490 |
| 0.073 |
0.570 |
| 0.190 |
0.717 |
| 0.300 |
0.830 |
| 0.400 |
0.877 |
| 0.500 |
0.915 |
| 0.600 |
0.906 |
| 0.800 |
0.873 |
| 1.000 |
0.821 |
| 2.000 |
0.705 |
| 3.000 |
0.601 |
| 4.000 |
0.474 |
SEY of Mo [2]
| Energy (keV) |
Yield |
| 0.250 |
0.797 |
| 0.300 |
0.864 |
| 0.350 |
0.894 |
| 0.400 |
0.900 |
| 0.450 |
0.894 |
| 0.500 |
0.886 |
| 0.550 |
0.872 |
| 0.600 |
0.858 |
| 0.650 |
0.830 |
| 0.700 |
0.809 |
| 0.750 |
0.784 |
| 0.800 |
0.765 |
| 0.850 |
0.739 |
| 0.900 |
0.728 |
| 0.950 |
0.710 |
| 1.000 |
0.675 |
| 1.200 |
0.654 |
| 1.400 |
0.622 |
| 1.500 |
0.563 |
| 1.800 |
0.519 |
| 2.000 |
0.478 |
| 2.500 |
0.440 |
| 3.000 |
0.393 |
| 3.500 |
0.356 |
| 4.000 |
0.322 |
| 4.500 |
0.297 |
| 5.000 |
0.280 |
SEY of Mo [3]
| Energy (keV) |
Yield |
| 1.000 |
1.600 |
| 3.000 |
0.891 |
| 5.000 |
0.592 |
| 10.000 |
0.376 |
| 20.000 |
0.255 |
| 30.000 |
0.174 |
SEY of Mo [4]
| Energy (keV) |
Yield |
| 2.500 |
0.894 |
| 5.000 |
0.606 |
| 10.000 |
0.381 |
| 15.000 |
0.285 |
| 20.000 |
0.236 |
| 25.000 |
0.214 |
SEY of Mo [5]
| Energy (keV) |
Yield |
| 0.100 |
0.550 |
| 0.200 |
1.000 |
| 0.300 |
1.240 |
| 0.500 |
1.540 |
| 1.000 |
1.410 |
| 2.000 |
1.040 |
| 3.000 |
0.840 |
| 4.000 |
0.710 |
| 5.000 |
0.630 |
| 6.000 |
0.560 |
| 7.000 |
0.520 |
| 8.000 |
0.500 |
References:
- [1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
- [2] Walker, C. G.; El-Gomati, M. M.; Assad, A. M.; Zadrazil, M., The secondary electron emission yield for
24 solid elements excited by primary electrons in the range 250-5000 eV: a theory/experiment comparison.
Scanning 2008, 30, 365-80.
- [3] Reimer, L.; Tolkamp, C., Measuring the backscattering coefficient and secondary electron yield inside a
scanning electron microscope. Scanning 1980, 3, 35.
- [4] Bongeler, R.; Golla, U.; Kussens, M.; Reimer, L.; Schendler, B.; Senkel, R.; Spranck, M.,
Electron-specimen interactions in low-voltage scanning electron microscopy. Scanning 1993,
15, 1-18.
- [5] Joy, D. C., A database of electron-solid interactions. (2008).
