Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of In [1]
Energy (keV) | Yield |
---|---|
0.050 | 0.600 |
0.073 | 0.704 |
0.100 | 0.769 |
0.200 | 0.989 |
0.300 | 1.051 |
0.400 | 1.056 |
0.500 | 1.065 |
0.600 | 1.041 |
0.800 | 0.991 |
1.000 | 0.916 |
1.600 | 0.794 |
2.000 | 0.694 |
3.000 | 0.543 |
4.000 | 0.445 |
References:
- [1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
- [2] Reimer, L.; Tolkamp, C., Measuring the backscattering coefficient and secondary electron yield inside a scanning electron microscope. Scanning 1980, 3, 35.
- [3] Arifov, U. A.; Kasymov, A. K., Secondary Emission and Structural Properties of Solids. New York, 1971.