Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Hf [1]
| Energy (keV) |
Yield |
| 0.170 |
0.470 |
| 0.300 |
0.870 |
| 0.400 |
1.123 |
| 0.500 |
1.353 |
| 0.600 |
1.450 |
| 0.700 |
1.500 |
| 0.800 |
1.356 |
| 1.000 |
1.160 |
| 1.200 |
1.050 |
| 1.400 |
0.978 |
SEY of Hf [2]
| Energy (keV) |
Yield |
| 0.170 |
0.925 |
| 0.250 |
1.263 |
| 0.300 |
1.442 |
| 0.350 |
1.536 |
| 0.400 |
1.575 |
| 0.450 |
1.575 |
| 0.500 |
1.575 |
| 0.550 |
1.545 |
| 0.600 |
1.536 |
| 0.650 |
1.479 |
| 0.700 |
1.450 |
| 0.750 |
1.424 |
| 0.800 |
1.406 |
| 0.850 |
1.379 |
| 0.900 |
1.335 |
| 0.950 |
1.311 |
| 1.000 |
1.295 |
| 1.200 |
1.192 |
| 1.400 |
1.133 |
| 1.600 |
1.043 |
| 1.800 |
0.980 |
| 2.000 |
0.937 |
| 2.500 |
0.832 |
| 3.000 |
0.751 |
| 3.500 |
0.687 |
| 4.000 |
0.633 |
| 4.500 |
0.587 |
| 5.000 |
0.547 |
SEY of Hf [3]
| Energy (keV) |
Yield |
| 0.063 |
1.518 |
| 0.082 |
1.721 |
| 0.110 |
1.941 |
| 0.132 |
2.081 |
| 0.155 |
2.211 |
| 0.184 |
2.256 |
| 0.203 |
2.318 |
| 0.232 |
2.352 |
| 0.258 |
2.385 |
| 0.284 |
2.396 |
| 0.306 |
2.413 |
| 0.332 |
2.402 |
| 0.358 |
2.408 |
| 0.382 |
2.396 |
| 0.480 |
2.318 |
| 0.580 |
2.250 |
| 0.682 |
2.183 |
| 0.782 |
2.115 |
| 0.882 |
2.064 |
| 0.985 |
2.025 |
SEY of Hf [4]
| Energy (keV) |
Yield |
| 0.064 |
1.270 |
| 0.084 |
1.386 |
| 0.108 |
1.467 |
| 0.135 |
1.548 |
| 0.159 |
1.630 |
| 0.184 |
1.630 |
| 0.210 |
1.657 |
| 0.236 |
1.650 |
| 0.259 |
1.657 |
| 0.285 |
1.643 |
| 0.310 |
1.630 |
| 0.334 |
1.609 |
| 0.360 |
1.596 |
| 0.383 |
1.576 |
| 0.487 |
1.514 |
| 0.586 |
1.467 |
| 0.686 |
1.426 |
| 0.785 |
1.392 |
| 0.885 |
1.351 |
| 0.984 |
1.338 |
References:
- [1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
- [2] Walker, C. G.; El-Gomati, M. M.; Assad, A. M.; Zadrazil, M., The secondary electron emission yield for
24 solid elements excited by primary electrons in the range 250-5000 eV: a theory/experiment comparison.
Scanning 2008, 30, 365-80.
- [3] Wang, J.; Wang, Y.; Xu, Y. H.; Zhang, B.; Wei, W., Research on the secondary electron yield of TiZrV-Pd
thin film coatings. Vacuum 2016, 131, 81-88.
