Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Ge [2]
| Energy (keV) | Yield |
|---|---|
| 0.050 | 0.290 |
| 0.100 | 0.473 |
| 0.150 | 0.631 |
| 0.200 | 0.715 |
| 0.400 | 0.743 |
| 0.600 | 0.699 |
| 0.800 | 0.668 |
| 1.000 | 0.608 |
| 1.500 | 0.471 |
| 2.000 | 0.398 |
| 3.000 | 0.312 |
| 4.000 | 0.264 |
References:
- [1] Reimer, L.; Tolkamp, C., Measuring the backscattering coefficient and secondary electron yield inside a scanning electron microscope. Scanning 1980, 3, 35.
- [2] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
- [3] Johnson, J. B.; McKay, K. G., Secondary electron emission from germanium. Phys. Rev. 1954, 93, 668-672.
- [4] Whetten, N. R., Methods in Experimental Physics. Academic Press, New York: 1962; Vol. IV.