Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Cu [1]
Energy (keV) |
Yield |
0.100 |
0.564 |
0.200 |
0.716 |
0.300 |
0.846 |
0.400 |
0.933 |
0.600 |
1.024 |
0.800 |
1.034 |
1.000 |
0.993 |
1.500 |
0.881 |
2.000 |
0.771 |
2.500 |
0.702 |
3.000 |
0.610 |
4.000 |
0.498 |
SEY of Cu [2]
Energy (keV) |
Yield |
0.250 |
0.576 |
0.300 |
0.685 |
0.350 |
0.768 |
0.400 |
0.808 |
0.450 |
0.852 |
0.500 |
0.882 |
0.550 |
0.890 |
0.600 |
0.906 |
0.650 |
0.898 |
0.700 |
0.914 |
0.750 |
0.906 |
0.800 |
0.898 |
0.850 |
0.890 |
0.900 |
0.882 |
0.950 |
0.882 |
1.000 |
0.852 |
1.200 |
0.830 |
1.400 |
0.795 |
1.500 |
0.742 |
1.800 |
0.691 |
2.000 |
0.646 |
2.500 |
0.567 |
3.000 |
0.501 |
3.500 |
0.460 |
4.000 |
0.418 |
4.500 |
0.380 |
5.000 |
0.354 |
SEY of Cu [3]
Energy (keV) |
Yield |
1.000 |
1.590 |
5.000 |
0.690 |
20.000 |
0.216 |
SEY of Cu [4]
Energy (keV) |
Yield |
5.000 |
0.390 |
5.000 |
0.291 |
30.000 |
0.119 |
30.000 |
0.105 |
SEY of Cu [5]
Energy (keV) |
Yield |
0.200 |
1.000 |
0.600 |
1.300 |
1.500 |
1.000 |
SEY of Cu [6]
Energy (keV) |
Yield |
2.500 |
0.750 |
5.000 |
0.478 |
10.000 |
0.310 |
15.000 |
0.224 |
20.000 |
0.174 |
25.000 |
0.161 |
SEY of Cu [7]
Energy (keV) |
Yield |
0.500 |
2.110 |
0.800 |
1.869 |
1.000 |
1.723 |
1.200 |
1.469 |
1.400 |
1.440 |
1.600 |
1.370 |
1.800 |
1.194 |
2.000 |
1.117 |
2.500 |
1.040 |
3.000 |
0.893 |
3.500 |
0.813 |
4.000 |
0.752 |
5.000 |
0.641 |
SEY of Cu [8]
Energy (keV) |
Yield |
0.500 |
1.009 |
1.000 |
0.892 |
1.500 |
0.726 |
2.000 |
0.588 |
3.000 |
0.422 |
4.000 |
0.326 |
5.000 |
0.275 |
6.000 |
0.245 |
7.000 |
0.216 |
8.000 |
0.196 |
9.000 |
0.180 |
10.000 |
0.167 |
SEY of Cu [9]
Energy (keV) |
Yield |
0.050 |
0.368 |
0.100 |
0.701 |
0.200 |
1.000 |
0.400 |
1.230 |
0.600 |
1.260 |
0.800 |
1.276 |
1.000 |
1.230 |
SEY of Cu [10]
Energy (keV) |
Yield |
0.500 |
1.410 |
1.000 |
1.328 |
2.000 |
0.992 |
3.000 |
0.813 |
4.000 |
0.724 |
5.000 |
0.649 |
6.000 |
0.604 |
7.000 |
0.567 |
8.000 |
0.537 |
9.000 |
0.522 |
10.000 |
0.500 |
SEY of Cu [11]
Energy (keV) |
Yield |
0.020 |
1.118 |
0.060 |
1.265 |
0.100 |
1.442 |
0.200 |
1.554 |
0.250 |
1.573 |
0.300 |
1.561 |
0.400 |
1.492 |
0.500 |
1.404 |
0.700 |
1.277 |
1.000 |
1.097 |
1.500 |
0.925 |
2.000 |
0.859 |
SEY of Cu [12]
Energy (keV) |
Yield |
0.010 |
0.040 |
0.012 |
0.050 |
0.013 |
0.050 |
0.015 |
0.090 |
0.018 |
0.130 |
0.016 |
1.060 |
0.014 |
0.910 |
0.014 |
0.620 |
0.014 |
0.400 |
0.019 |
0.080 |
0.052 |
0.290 |
0.078 |
0.470 |
0.104 |
0.670 |
0.146 |
0.910 |
0.208 |
1.100 |
0.270 |
1.240 |
0.329 |
1.320 |
0.391 |
1.380 |
0.468 |
1.440 |
0.568 |
1.460 |
0.666 |
1.470 |
0.739 |
1.470 |
0.810 |
1.450 |
0.880 |
1.440 |
0.981 |
1.410 |
SEY of Cu [13]
Energy (keV) |
Yield |
0.016 |
0.998 |
0.019 |
0.970 |
0.016 |
0.942 |
0.019 |
0.891 |
0.019 |
0.853 |
0.022 |
0.797 |
0.022 |
0.689 |
0.022 |
0.600 |
0.019 |
0.506 |
0.019 |
0.417 |
0.019 |
0.333 |
0.019 |
0.263 |
0.019 |
0.202 |
0.019 |
0.159 |
0.019 |
0.113 |
0.016 |
0.089 |
0.016 |
0.061 |
0.022 |
0.047 |
0.026 |
0.024 |
0.028 |
0.047 |
0.032 |
0.075 |
0.035 |
0.108 |
0.041 |
0.127 |
0.041 |
0.155 |
0.044 |
0.178 |
0.053 |
0.202 |
0.053 |
0.221 |
0.065 |
0.295 |
0.071 |
0.380 |
0.083 |
0.460 |
0.095 |
0.534 |
0.101 |
0.600 |
0.113 |
0.666 |
0.125 |
0.727 |
0.131 |
0.773 |
0.143 |
0.825 |
0.152 |
0.872 |
0.164 |
0.909 |
0.173 |
0.942 |
0.179 |
0.975 |
0.192 |
0.998 |
0.204 |
1.036 |
0.212 |
1.050 |
0.218 |
1.069 |
0.231 |
1.096 |
0.237 |
1.106 |
0.249 |
1.129 |
0.258 |
1.143 |
0.267 |
1.167 |
0.276 |
1.181 |
0.285 |
1.190 |
0.297 |
1.209 |
0.306 |
1.228 |
0.318 |
1.247 |
0.336 |
1.256 |
0.351 |
1.274 |
0.369 |
1.293 |
0.385 |
1.303 |
0.399 |
1.317 |
0.414 |
1.321 |
0.430 |
1.340 |
0.451 |
1.345 |
0.469 |
1.354 |
0.487 |
1.368 |
0.496 |
1.368 |
0.508 |
1.363 |
0.601 |
1.387 |
0.707 |
1.382 |
0.810 |
1.373 |
0.900 |
1.354 |
0.997 |
1.345 |
SEY of Cu [14]
Energy (keV) |
Yield |
0.012 |
0.270 |
0.014 |
0.290 |
0.016 |
0.310 |
0.018 |
0.340 |
0.020 |
0.360 |
0.023 |
0.370 |
0.026 |
0.390 |
0.028 |
0.410 |
0.031 |
0.410 |
0.035 |
0.420 |
0.023 |
0.270 |
0.034 |
0.370 |
0.052 |
0.430 |
0.066 |
0.500 |
0.093 |
0.650 |
0.114 |
0.760 |
0.171 |
0.970 |
0.212 |
1.090 |
0.253 |
1.170 |
0.290 |
1.210 |
0.350 |
1.260 |
0.392 |
1.280 |
0.433 |
1.300 |
0.488 |
1.300 |
0.593 |
1.310 |
0.662 |
1.300 |
0.728 |
1.290 |
0.781 |
1.280 |
0.841 |
1.260 |
0.940 |
1.240 |
SEY of Cu [15]
Energy (keV) |
Yield |
0.005 |
0.390 |
0.044 |
0.491 |
0.034 |
0.506 |
0.053 |
0.612 |
0.081 |
0.718 |
0.091 |
0.778 |
0.186 |
0.854 |
0.290 |
0.894 |
0.395 |
0.879 |
0.491 |
0.844 |
0.586 |
0.809 |
0.691 |
0.748 |
0.795 |
0.713 |
0.900 |
0.687 |
0.995 |
0.647 |
1.499 |
0.521 |
1.994 |
0.430 |
2.984 |
0.350 |
SEY of Cu [16]
Energy (keV) |
Yield |
0.069 |
0.525 |
0.075 |
0.564 |
0.116 |
0.783 |
0.152 |
0.866 |
0.175 |
0.943 |
0.246 |
1.089 |
0.299 |
1.159 |
0.353 |
1.201 |
0.406 |
1.248 |
0.447 |
1.274 |
0.495 |
1.290 |
0.554 |
1.306 |
0.601 |
1.315 |
0.643 |
1.315 |
0.695 |
1.312 |
0.737 |
1.309 |
0.808 |
1.306 |
0.849 |
1.296 |
0.908 |
1.286 |
0.949 |
1.274 |
0.996 |
1.264 |
1.050 |
1.252 |
1.103 |
1.239 |
1.150 |
1.229 |
1.197 |
1.220 |
1.251 |
1.207 |
1.304 |
1.191 |
1.357 |
1.175 |
1.410 |
1.169 |
1.451 |
1.153 |
1.498 |
1.140 |
1.552 |
1.128 |
1.594 |
1.115 |
1.646 |
1.099 |
1.693 |
1.089 |
1.747 |
1.076 |
1.794 |
1.070 |
1.853 |
1.054 |
1.900 |
1.044 |
1.948 |
1.042 |
2.001 |
1.025 |
2.048 |
1.010 |
2.101 |
1.000 |
2.143 |
0.994 |
2.202 |
0.981 |
2.249 |
0.971 |
2.302 |
0.965 |
2.343 |
0.956 |
2.402 |
0.952 |
2.449 |
0.936 |
2.497 |
0.930 |
2.544 |
0.924 |
2.597 |
0.917 |
2.645 |
0.905 |
2.698 |
0.901 |
2.757 |
0.889 |
2.792 |
0.882 |
2.851 |
0.879 |
2.892 |
0.872 |
2.940 |
0.863 |
2.993 |
0.863 |
SEY of Cu [17]
Energy (keV) |
Yield |
0.019 |
0.417 |
0.016 |
0.526 |
0.035 |
0.671 |
0.065 |
0.816 |
0.095 |
0.961 |
0.119 |
1.091 |
0.146 |
1.174 |
0.171 |
1.251 |
0.198 |
1.313 |
0.222 |
1.339 |
0.247 |
1.370 |
0.274 |
1.391 |
0.301 |
1.412 |
0.328 |
1.417 |
0.358 |
1.417 |
0.380 |
1.423 |
0.410 |
1.423 |
0.437 |
1.423 |
0.464 |
1.417 |
0.486 |
1.407 |
0.516 |
1.396 |
0.543 |
1.391 |
0.567 |
1.391 |
0.592 |
1.386 |
0.619 |
1.381 |
0.646 |
1.370 |
0.676 |
1.355 |
0.700 |
1.350 |
0.724 |
1.350 |
0.754 |
1.334 |
0.784 |
1.339 |
0.811 |
1.329 |
0.836 |
1.324 |
0.855 |
1.308 |
0.885 |
1.298 |
0.912 |
1.293 |
0.933 |
1.288 |
0.955 |
1.283 |
0.982 |
1.272 |
1.012 |
1.262 |
1.039 |
1.262 |
1.067 |
1.257 |
1.096 |
1.246 |
1.145 |
1.236 |
1.178 |
1.220 |
1.205 |
1.215 |
1.226 |
1.220 |
1.254 |
1.204 |
1.289 |
1.194 |
1.313 |
1.194 |
1.330 |
1.189 |
1.360 |
1.179 |
1.387 |
1.169 |
1.417 |
1.179 |
1.444 |
1.169 |
1.463 |
1.169 |
1.490 |
1.158 |
1.514 |
1.158 |
1.547 |
1.148 |
1.571 |
1.138 |
1.593 |
1.138 |
1.625 |
1.122 |
1.650 |
1.122 |
1.672 |
1.122 |
1.699 |
1.111 |
1.726 |
1.106 |
1.750 |
1.091 |
1.786 |
1.085 |
1.808 |
1.085 |
1.832 |
1.080 |
1.862 |
1.080 |
1.891 |
1.075 |
1.916 |
1.059 |
1.943 |
1.049 |
1.970 |
1.054 |
SEY of Cu [18]
Energy (keV) |
Yield |
0.064 |
0.983 |
0.081 |
1.084 |
0.107 |
1.155 |
0.133 |
1.208 |
0.159 |
1.255 |
0.183 |
1.250 |
0.207 |
1.250 |
0.233 |
1.250 |
0.257 |
1.232 |
0.283 |
1.208 |
0.309 |
1.196 |
0.337 |
1.178 |
0.357 |
1.161 |
0.383 |
1.143 |
0.487 |
1.072 |
0.587 |
1.036 |
0.682 |
1.001 |
0.784 |
0.977 |
0.884 |
0.953 |
0.986 |
0.942 |
References:
- [1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
- [2] Walker, C. G.; El-Gomati, M. M.; Assad, A. M.; Zadrazil, M., The secondary electron emission yield for
24 solid elements excited by primary electrons in the range 250-5000 eV: a theory/experiment comparison.
Scanning 2008, 30, 365-80.
- [3] Reimer, L.; Tolkamp, C., Measuring the backscattering coefficient and secondary electron yield inside a
scanning electron microscope. Scanning 1980, 3, 35.
- [4] Wittry, D. B., In: Proc. 4th Conf. on X-ray Optics and Microanalysis, Hermann Paris, Castaing,
R., Ed. Hermann Paris, 1966; p 168.
- [5] Whetten, N. R., Methods in Experimental Physics. Academic Press, New York: 1962; Vol. IV.
- [6] Moncrieff, D. A.; Barker, P. R., Secondary electron emission in the scanning electron microscope.
Scanning 1978, 1, 195-197.
- [7] Bongeler, R.; Golla, U.; Kussens, M.; Reimer, L.; Schendler, B.; Senkel, R.; Spranck, M.,
Electron-specimen interactions in low-voltage scanning electron microscopy. Scanning 1993,
15, 1-18.
- [8] Shimizu, R., Secondary electron yield with primary electron beam of kiloelectronvolts. J. Appl.
Phys. 1974, 45, 2107-2111.
- [9] Bruining, H.; Boer, J. M. D., Secondary electron emission of metals. Physica 1938, V, 17-30.
- [10] Koshikawa, T.; Shimizu, R., Secondary electron and backscattering measurements for polycrystalline
copper with a spherical retarding-field analyser. J. Phy. D: Appl. Phys. 1973, 6,
1369.
- [11] Septier, A.; Belgarovi, M., IEEE Trans. Elect. Insul. 1985, 20, 725.
- [12] Gonzalez, L. A.; Angelucci, M.; Larciprete, R.; Cimino, R., The secondary electron yield of nobel metal
surfaces. AIP Adv. 2017, 7, 115203.
- [13] Cimino, R.; Gonzalez, L. A.; Larciprete, R.; Gaspare, A. D.; Iadarola, G.; Rumolo, G., Detailed
investigation of the low energy secondary electron yield of technical Cu and its relevance for the LHC.
Phys. Rev. ST: Accel. Beams 2015, 18, 051002.
- [14] Hu, X. C.; Cao, M.; Cui, W. Z., Influence of surface topography on the secondary electron yield of
clean Cu samples. Micron 2016, 90, 71-77.
- [15] Bojko, I.; Hilleret, N.; Scheuerlein, C., Influence of air exposures and thermal treatments on the
secondary electron yield of copper. J. Vac. Sci. Technol. A 2000, 18, 972-979.
- [16] Ahmed, M. T., Secondary electron yield measurements on materials of interest to vacuum electron
communication devices, Ph.D. Dissertation, New Maxico, 2020.
- [17] Wang, J.; Wang, Y.; Xu, Y. H.; Zhang, B.; Wei, W., Research on the secondary electron yield of TiZrV-Pd
thin film coatings. Vacuum 2016, 131, 81-88.