Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Cr [1]
| Energy (keV) | Yield |
|---|---|
| 0.140 | 0.445 |
| 0.180 | 0.521 |
| 0.200 | 0.785 |
| 0.250 | 0.972 |
| 0.300 | 1.003 |
| 0.350 | 1.022 |
| 0.400 | 1.022 |
| 0.450 | 1.013 |
| 0.500 | 1.003 |
| 0.550 | 1.003 |
| 0.600 | 0.991 |
| 0.650 | 0.982 |
| 0.700 | 0.954 |
| 0.750 | 0.935 |
| 0.850 | 0.891 |
| 0.900 | 0.882 |
| 0.950 | 0.849 |
| 1.000 | 0.817 |
| 1.200 | 0.769 |
| 1.500 | 0.712 |
| 1.600 | 0.665 |
| 1.800 | 0.615 |
| 2.000 | 0.552 |
| 2.500 | 0.501 |
| 3.000 | 0.463 |
| 3.500 | 0.424 |
| 4.000 | 0.396 |
| 4.500 | 0.370 |
References:
- [1] Walker, C. G.; El-Gomati, M. M.; Assad, A. M.; Zadrazil, M., The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250-5000 eV: a theory/experiment comparison. Scanning 2008, 30, 365-80.
- [2] Joy, D. C., A database of electron-solid interactions. (2008).
- [3] Wittry, D. B., In: Proc. 4th Conf. on X-ray Optics and Microanalysis, Hermann Paris, Castaing, R., Ed. Hermann Paris, 1966; p 168.