Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of C [1]
Energy (keV) |
Yield |
0.100 |
0.709 |
0.200 |
0.820 |
0.300 |
0.850 |
0.400 |
0.824 |
0.600 |
0.745 |
0.800 |
0.656 |
1.000 |
0.543 |
2.000 |
0.308 |
3.000 |
0.209 |
SEY of C [2]
Energy (keV) |
Yield |
0.250 |
0.658 |
0.300 |
0.696 |
0.350 |
0.707 |
0.400 |
0.701 |
0.450 |
0.685 |
0.500 |
0.669 |
0.550 |
0.642 |
0.600 |
0.617 |
0.650 |
0.603 |
0.700 |
0.584 |
0.750 |
0.561 |
0.800 |
0.539 |
0.850 |
0.531 |
0.900 |
0.506 |
0.950 |
0.494 |
1.000 |
0.467 |
1.200 |
0.446 |
1.400 |
0.418 |
1.500 |
0.380 |
1.800 |
0.354 |
2.000 |
0.329 |
2.500 |
0.296 |
3.000 |
0.270 |
3.500 |
0.247 |
4.000 |
0.228 |
4.500 |
0.216 |
5.000 |
0.207 |
SEY of C [3]
Energy (keV) |
Yield |
2.500 |
0.334 |
5.000 |
0.211 |
10.000 |
0.143 |
15.000 |
0.106 |
20.000 |
0.079 |
25.000 |
0.052 |
SEY of C [4]
Energy (keV) |
Yield |
0.300 |
0.900 |
0.350 |
1.000 |
0.500 |
0.155 |
0.800 |
1.136 |
1.000 |
0.990 |
1.200 |
0.869 |
1.400 |
0.709 |
1.600 |
0.655 |
1.800 |
0.595 |
2.000 |
0.527 |
2.500 |
0.442 |
3.000 |
0.400 |
3.500 |
0.316 |
4.000 |
0.316 |
5.000 |
0.315 |
SEY of C [5]
Energy (keV) |
Yield |
5.000 |
0.177 |
5.000 |
0.164 |
30.000 |
0.067 |
30.000 |
0.050 |
SEY of C [6]
Energy (keV) |
Yield |
0.200 |
0.920 |
0.300 |
1.100 |
0.400 |
0.980 |
0.500 |
1.020 |
0.600 |
0.970 |
0.700 |
0.950 |
0.800 |
0.950 |
0.900 |
0.900 |
1.000 |
0.720 |
1.500 |
0.390 |
2.000 |
0.360 |
3.000 |
0.330 |
4.000 |
0.250 |
SEY of C [7]
Energy (keV) |
Yield |
0.015 |
0.734 |
0.029 |
0.753 |
0.034 |
0.764 |
0.054 |
0.779 |
0.054 |
0.803 |
0.067 |
0.836 |
0.081 |
0.866 |
0.087 |
0.893 |
0.093 |
0.917 |
0.113 |
0.938 |
0.119 |
0.956 |
0.139 |
0.968 |
0.145 |
0.977 |
0.172 |
0.977 |
0.204 |
0.977 |
0.230 |
0.980 |
0.262 |
0.974 |
0.289 |
0.965 |
0.308 |
0.962 |
0.348 |
0.953 |
0.380 |
0.941 |
0.405 |
0.932 |
0.432 |
0.926 |
0.458 |
0.914 |
0.477 |
0.905 |
0.491 |
0.902 |
0.497 |
0.872 |
0.516 |
0.869 |
0.549 |
0.872 |
0.581 |
0.863 |
0.620 |
0.854 |
0.660 |
0.845 |
0.699 |
0.836 |
0.731 |
0.830 |
0.771 |
0.821 |
0.796 |
0.809 |
0.829 |
0.803 |
0.862 |
0.794 |
0.900 |
0.788 |
0.927 |
0.779 |
0.966 |
0.767 |
0.985 |
0.764 |
1.024 |
0.758 |
1.063 |
0.749 |
1.095 |
0.743 |
1.128 |
0.737 |
1.161 |
0.732 |
1.206 |
0.723 |
1.239 |
0.716 |
1.258 |
0.716 |
1.291 |
0.707 |
1.323 |
0.707 |
1.356 |
0.699 |
1.408 |
0.693 |
1.441 |
0.686 |
1.486 |
0.683 |
1.532 |
0.678 |
1.571 |
0.672 |
1.610 |
0.669 |
1.649 |
0.663 |
1.694 |
0.660 |
1.721 |
0.656 |
1.773 |
0.651 |
1.825 |
0.645 |
1.870 |
0.642 |
1.929 |
0.639 |
1.981 |
0.633 |
2.040 |
0.627 |
2.072 |
0.624 |
2.111 |
0.618 |
2.163 |
0.612 |
2.215 |
0.612 |
2.255 |
0.609 |
2.300 |
0.603 |
2.332 |
0.600 |
2.365 |
0.600 |
2.404 |
0.594 |
2.463 |
0.588 |
2.502 |
0.591 |
2.560 |
0.585 |
2.612 |
0.576 |
2.658 |
0.576 |
2.690 |
0.573 |
2.762 |
0.573 |
2.801 |
0.564 |
2.853 |
0.564 |
SEY of C [8]
Energy (keV) |
Yield |
0.112 |
0.592 |
0.148 |
0.671 |
0.233 |
0.745 |
0.314 |
0.753 |
0.387 |
0.714 |
0.457 |
0.684 |
0.538 |
0.663 |
0.617 |
0.627 |
0.710 |
0.600 |
0.810 |
0.561 |
0.889 |
0.538 |
0.967 |
0.518 |
1.037 |
0.497 |
1.131 |
0.467 |
1.246 |
0.462 |
1.354 |
0.429 |
1.433 |
0.416 |
1.545 |
0.385 |
1.702 |
0.383 |
1.762 |
0.360 |
SEY of C [9]
Energy (keV) |
Yield |
0.013 |
0.026 |
0.022 |
0.039 |
0.043 |
0.089 |
0.064 |
0.151 |
0.083 |
0.228 |
0.102 |
0.286 |
0.122 |
0.344 |
0.151 |
0.435 |
0.188 |
0.488 |
0.201 |
0.512 |
0.250 |
0.536 |
0.300 |
0.539 |
0.351 |
0.531 |
0.400 |
0.515 |
0.449 |
0.498 |
0.498 |
0.491 |
0.600 |
0.466 |
0.696 |
0.439 |
0.800 |
0.398 |
0.900 |
0.389 |
1.000 |
0.379 |
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24 solid elements excited by primary electrons in the range 250-5000 eV: a theory/experiment comparison.
Scanning 2008, 30, 365-80.
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Scanning 1978, 1, 195-197.
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Electron-specimen interactions in low-voltage scanning electron microscopy. Scanning 1993,
15, 1-18.
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R., Ed. Hermann Paris, 1966; p 168.
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1988; p 149.
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Henderson, S.; Zimmermann, F., Eds. CERN: Napa, California, USA, 2005; pp 107-111.
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Sci. 2010, 257, 354-361.
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