Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Bi [1]
| Energy (keV) | Yield |
|---|---|
| 0.100 | 0.540 |
| 0.200 | 0.700 |
| 0.300 | 0.790 |
| 0.400 | 0.800 |
| 0.600 | 0.890 |
| 0.800 | 0.900 |
| 1.000 | 0.890 |
| 2.000 | 0.729 |
| 3.000 | 0.590 |
| 4.000 | 0.570 |
References:
- [1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
- [2] Reimer, L.; Tolkamp, C., Measuring the backscattering coefficient and secondary electron yield inside a scanning electron microscope. Scanning 1980, 3, 35.
- [3] Wittry, D. B., In: Proc. 4th Conf. on X-ray Optics and Microanalysis, Hermann Paris, Castaing, R., Ed. Hermann Paris, 1966; p 168.