Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Be [1]
| Energy (keV) |
Yield |
| 0.100 |
0.440 |
| 0.150 |
0.444 |
| 0.200 |
0.447 |
| 0.300 |
0.406 |
| 0.400 |
0.348 |
| 0.500 |
0.305 |
| 0.600 |
0.263 |
| 0.800 |
0.213 |
| 1.000 |
0.175 |
| 2.000 |
0.118 |
| 3.000 |
0.098 |
| 4.000 |
0.085 |
SEY of Be [2]
| Energy (keV) |
Yield |
| 1.000 |
1.745 |
| 2.000 |
0.863 |
| 3.000 |
0.596 |
| 4.000 |
0.471 |
| 5.000 |
0.392 |
| 6.000 |
0.334 |
| 7.000 |
0.298 |
| 8.000 |
0.267 |
| 9.000 |
0.235 |
| 10.000 |
0.196 |
SEY of Be [3]
| Energy (keV) |
Yield |
| 1.000 |
1.690 |
| 3.000 |
0.770 |
| 5.000 |
0.551 |
| 10.000 |
0.245 |
| 20.000 |
0.152 |
| 30.000 |
0.079 |
SEY of Be [4]
| Energy (keV) |
Yield |
| 0.050 |
0.386 |
| 0.100 |
0.483 |
| 0.150 |
0.617 |
| 0.200 |
0.528 |
| 0.300 |
0.500 |
| 0.400 |
0.460 |
| 0.500 |
0.420 |
| 0.600 |
0.386 |
| 0.700 |
0.353 |
| 0.800 |
0.324 |
References:
- [1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
- [2] Shimizu, R., Secondary electron yield with primary electron beam of kiloelectronvolts. J. Appl.
Phys. 1974, 45, 2107-2111.
- [3] Reimer, L.; Tolkamp, C., Measuring the backscattering coefficient and secondary electron yield inside a
scanning electron microscope. Scanning 1980, 3, 35.
- [4] Bruining, H.; Boer, J. M. D., Secondary electron emission of metals. Physica 1938, V, 17-30.
