Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Al [1]
| Energy (keV) |
Yield |
| 0.100 |
0.571 |
| 0.200 |
0.616 |
| 0.300 |
0.642 |
| 0.400 |
0.640 |
| 0.600 |
0.580 |
| 0.800 |
0.500 |
| 1.000 |
0.450 |
| 2.000 |
0.304 |
| 3.000 |
0.228 |
| 4.000 |
0.180 |
SEY of Al [2]
| Energy (keV) |
Yield |
| 0.300 |
1.326 |
| 0.350 |
1.216 |
| 0.400 |
1.246 |
| 0.450 |
1.124 |
| 0.500 |
1.105 |
| 0.550 |
1.047 |
| 0.600 |
1.022 |
| 0.650 |
0.952 |
| 0.700 |
0.929 |
| 0.750 |
0.915 |
| 0.800 |
0.879 |
| 0.850 |
0.852 |
| 0.900 |
0.781 |
| 0.950 |
0.801 |
| 1.000 |
0.746 |
| 1.200 |
0.717 |
| 1.400 |
0.657 |
| 1.600 |
0.593 |
| 1.800 |
0.539 |
| 2.000 |
0.499 |
| 2.500 |
0.412 |
| 3.000 |
0.358 |
| 3.500 |
0.308 |
| 4.000 |
0.287 |
| 4.500 |
0.267 |
| 5.000 |
0.265 |
SEY of Al [3]
| Energy (keV) |
Yield |
| 1.000 |
1.666 |
| 2.000 |
0.882 |
| 3.000 |
0.620 |
| 4.000 |
0.506 |
| 5.000 |
0.439 |
| 6.000 |
0.353 |
| 7.000 |
0.314 |
| 8.000 |
0.275 |
| 9.000 |
0.255 |
| 10.000 |
0.232 |
SEY of Al [4]
| Energy (keV) |
Yield |
| 2.000 |
1.000 |
| 3.000 |
0.730 |
| 4.000 |
0.600 |
| 5.000 |
0.530 |
| 6.000 |
0.430 |
| 7.000 |
0.370 |
| 10.000 |
0.280 |
| 12.000 |
0.240 |
| 15.000 |
0.210 |
| 18.000 |
0.180 |
| 20.000 |
0.170 |
SEY of Al [5]
| Energy (keV) |
Yield |
| 10.000 |
0.153 |
| 15.000 |
0.265 |
| 20.000 |
0.100 |
| 25.000 |
0.062 |
| 28.000 |
0.045 |
| 30.000 |
0.061 |
SEY of Al [6]
| Energy (keV) |
Yield |
| 1.000 |
1.580 |
| 3.000 |
1.000 |
| 5.000 |
0.501 |
| 15.000 |
0.184 |
| 20.000 |
0.159 |
| 30.000 |
0.096 |
SEY of Al [7]
| Energy (keV) |
Yield |
| 1.000 |
0.658 |
| 5.000 |
0.416 |
| 10.000 |
0.264 |
| 20.000 |
0.149 |
| 25.000 |
0.137 |
SEY of Al [8]
| Energy (keV) |
Yield |
| 0.050 |
1.000 |
| 0.100 |
1.320 |
| 0.200 |
1.930 |
| 0.300 |
2.140 |
| 0.400 |
2.170 |
| 0.500 |
2.100 |
| 0.600 |
1.980 |
References:
- [1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
- [2] Walker, C. G.; El-Gomati, M. M.; Assad, A. M.; Zadrazil, M., The secondary electron emission yield for
24 solid elements excited by primary electrons in the range 250-5000 eV: a theory/experiment comparison.
Scanning 2008, 30, 365-80.
- [3] Shimizu, R., Secondary electron yield with primary electron beam of kiloelectronvolts. J. Appl.
Phys. 1974, 45, 2107-2111.
- [4] Kanter, H., Contribution of backscattered electrons to secondary electron formation. Phys. Rev.
1961, 121, 681-684.
- [5] Joy, D. C., A database of electron-solid interactions. (2008).
- [6] Reimer, L.; Tolkamp, C., Measuring the backscattering coefficient and secondary electron yield inside a
scanning electron microscope. Scanning 1980, 3, 35.
- [7] Moncrieff, D. A.; Barker, P. R., Secondary electron emission in the scanning electron microscope.
Scanning 1978, 1, 195-197.
- [8] Bruining, H.; Boer, J. M. D., Secondary electron emission of metals. Physica 1938, V, 17-30.
