Cite as: Mehnaz, T.F. Yang, Bo Da and Z.J. Ding, Exploring Universal Formula for Absolute Secondary Electron Yield
by
using Machine Learning Methods. (unpublished).
SEY of Ag [1]
| Energy (keV) |
Yield |
| 0.020 |
0.480 |
| 0.100 |
0.704 |
| 0.150 |
0.861 |
| 0.200 |
0.958 |
| 0.300 |
1.135 |
| 0.400 |
1.239 |
| 0.600 |
1.332 |
| 0.800 |
1.346 |
| 1.000 |
1.326 |
| 2.000 |
0.875 |
| 3.000 |
0.655 |
| 4.000 |
0.508 |
SEY of Ag [2]
| Energy (keV) |
Yield |
| 0.400 |
0.990 |
| 0.450 |
1.029 |
| 0.500 |
1.063 |
| 0.550 |
1.077 |
| 0.600 |
1.077 |
| 0.650 |
1.069 |
| 0.700 |
1.077 |
| 0.750 |
1.063 |
| 0.800 |
1.056 |
| 0.850 |
1.050 |
| 0.900 |
1.042 |
| 0.950 |
1.036 |
| 1.000 |
1.016 |
| 1.200 |
1.003 |
| 1.400 |
0.971 |
| 1.500 |
0.917 |
| 1.800 |
0.865 |
| 2.000 |
0.816 |
| 2.500 |
0.722 |
| 3.000 |
0.651 |
| 3.500 |
0.607 |
| 4.000 |
0.558 |
| 4.500 |
0.517 |
| 5.000 |
0.484 |
SEY of Ag [3]
| Energy (keV) |
Yield |
| 0.500 |
1.216 |
| 1.000 |
1.212 |
| 1.200 |
1.039 |
| 2.000 |
0.882 |
| 3.000 |
0.686 |
| 4.000 |
0.559 |
| 5.000 |
0.467 |
| 6.000 |
0.401 |
| 7.000 |
0.353 |
| 8.000 |
0.314 |
| 9.000 |
0.294 |
| 10.000 |
0.265 |
SEY of Ag [4]
| Energy (keV) |
Yield |
| 1.000 |
1.615 |
| 3.000 |
0.900 |
| 5.000 |
0.626 |
| 10.000 |
0.358 |
| 20.000 |
0.264 |
| 30.000 |
0.157 |
SEY of Ag [5]
| Energy (keV) |
Yield |
| 2.500 |
0.932 |
| 5.000 |
0.636 |
| 10.000 |
0.410 |
| 15.000 |
0.285 |
| 20.000 |
0.236 |
| 25.000 |
0.214 |
SEY of Ag [6]
| Energy (keV) |
Yield |
| 0.050 |
0.532 |
| 0.070 |
1.560 |
| 0.100 |
0.862 |
| 0.200 |
1.170 |
| 0.400 |
1.480 |
| 0.600 |
1.560 |
| 0.800 |
1.560 |
SEY of Ag [7]
| Energy (keV) |
Yield |
| 5.000 |
0.500 |
| 5.000 |
0.296 |
| 30.000 |
0.152 |
| 30.000 |
0.123 |
SEY of Ag [8]
| Energy (keV) |
Yield |
| 0.599 |
1.608 |
| 0.699 |
1.666 |
| 0.791 |
1.551 |
| 0.890 |
1.619 |
| 0.999 |
1.562 |
| 1.482 |
1.515 |
| 1.998 |
1.330 |
| 2.298 |
1.260 |
| 2.547 |
1.237 |
| 2.756 |
1.224 |
| 2.998 |
1.178 |
| 3.197 |
1.133 |
| 3.439 |
1.109 |
| 3.689 |
1.086 |
| 4.005 |
1.039 |
| 4.156 |
1.027 |
| 4.372 |
1.027 |
| 4.564 |
0.980 |
| 4.805 |
0.980 |
| 5.013 |
0.969 |
SEY of Ag [9]
| Energy (keV) |
Yield |
| 0.011 |
0.050 |
| 0.013 |
0.080 |
| 0.014 |
0.100 |
| 0.016 |
0.120 |
| 0.016 |
0.080 |
| 0.018 |
0.140 |
| 0.045 |
0.480 |
| 0.066 |
0.710 |
| 0.110 |
0.960 |
| 0.149 |
1.140 |
| 0.193 |
1.300 |
| 0.240 |
1.420 |
| 0.312 |
1.550 |
| 0.437 |
1.680 |
| 0.541 |
1.710 |
| 0.639 |
1.720 |
| 0.735 |
1.720 |
| 0.831 |
1.690 |
| 0.997 |
1.680 |
SEY of Ag [10]
| Energy (keV) |
Yield |
| 0.028 |
0.430 |
| 0.037 |
0.691 |
| 0.057 |
0.834 |
| 0.096 |
0.936 |
| 0.116 |
1.021 |
| 0.165 |
1.165 |
| 0.214 |
1.288 |
| 0.303 |
1.394 |
| 0.411 |
1.437 |
| 0.510 |
1.453 |
| 0.598 |
1.437 |
| 0.706 |
1.426 |
| 0.805 |
1.394 |
| 0.913 |
1.378 |
| 1.001 |
1.363 |
| 1.207 |
1.314 |
| 1.502 |
1.251 |
| 2.013 |
1.144 |
| 2.505 |
1.080 |
| 3.007 |
1.005 |
SEY of Ag [11]
| Energy (keV) |
Yield |
| 0.028 |
0.499 |
| 0.057 |
0.803 |
| 0.047 |
0.994 |
| 0.086 |
1.128 |
| 0.116 |
1.223 |
| 0.156 |
1.383 |
| 0.214 |
1.474 |
| 0.303 |
1.549 |
| 0.401 |
1.549 |
| 0.528 |
1.538 |
| 0.607 |
1.512 |
| 0.726 |
1.463 |
| 0.814 |
1.437 |
| 0.913 |
1.400 |
| 1.207 |
1.288 |
| 1.512 |
1.203 |
| 1.993 |
1.091 |
| 2.505 |
1.000 |
| 3.007 |
0.973 |
References:
- [1] Bronstein, I. M.; Fraiman, B. S., Vtorichnaya elektronnaya emissiya. Nauka, Moskva 1969, 340.
- [2] Walker, C. G.; El-Gomati, M. M.; Assad, A. M.; Zadrazil, M., The secondary electron emission yield for
24 solid elements excited by primary electrons in the range 250-5000 eV: a theory/experiment comparison.
Scanning 2008, 30, 365-80.
- [3] Shimizu, R., Secondary electron yield with primary electron beam of kiloelectronvolts. J. Appl.
Phys. 1974, 45, 2107-2111.
- [4] Reimer, L.; Tolkamp, C., Measuring the backscattering coefficient and secondary electron yield inside a
scanning electron microscope. Scanning 1980, 3, 35.
- [5] Moncrieff, D. A.; Barker, P. R., Secondary electron emission in the scanning electron microscope.
Scanning 1978, 1, 195-197.
- [6] Bruining, H.; Boer, J. M. D., Secondary electron emission of metals. Physica 1938, V, 17-30.
- [7] Wittry, D. B., In: Proc. 4th Conf. on X-ray Optics and Microanalysis, Hermann Paris, Castaing,
R., Ed. Hermann Paris, 1966; p 168.
- [8] Miyake, H.; Nitta, K.; Michizono, S.; Saito, Y., Secondary electron emission measurement of insulating
materials for spacecraft. J. Vac. Soc. Jpn. 2007, 50, 378-381.
- [9] Gonzalez, L. A.; Angelucci, M.; Larciprete, R.; Cimino, R., The secondary electron yield of nobel metal
surfaces. AIP Adv. 2017, 7, 115203.
- [10] Zhang, H. B.; Hu, X. C.; Cao, M.; Zhang, N.; Cui, W. Z., The quantitative effect of thermal treatment
on the secondary electron yield from air-exposed silver surface. Vacuum 2014, 102,
12-15.
