Cite as: P. Guo, S.F. Mao, Y.B. Zou, T.F. Yang, H. Miao, Z.J. Ding, Monte Carlo Simulation Study on Secondary Electron Yield of SiO2,
Resu. Phys. 58 (2024) 107472.
DOI:
10.1016/j.rinp.2024.107472
SEY of SiO2
| Energy (eV) |
Yield |
| 100 |
2.24875 |
| 200 |
3.59038 |
| 300 |
4.44111 |
| 400 |
4.87479 |
| 500 |
5.03852 |
| 600 |
5.04271 |
| 700 |
4.92634 |
| 800 |
4.77675 |
| 900 |
4.58165 |
| 1000 |
4.37640 |
| 1200 |
3.93701 |
| 1500 |
3.36315 |
| 2000 |
2.63456 |
| 2500 |
2.12325 |
| 3000 |
1.76079 |
| 4000 |
1.34646 |
| 5000 |
1.08010 |
